Development of a Transmission Line Model for the Thickness Prediction of Thin Films via the Infrared Interference Method†
Mpilitos, C.; Amanatiadis, S.; Apostolidis, G.; Zygiridis, T.; Kantartzis, N.; Karagiannis, G. Development of a Transmission Line Model for the Thickness Prediction of Thin Films via the Infrared Interference Method. Technologies 2018, 6, 122. https://doi.org/10.3390/technologies6040122
Mpilitos C, Amanatiadis S, Apostolidis G, Zygiridis T, Kantartzis N, Karagiannis G. Development of a Transmission Line Model for the Thickness Prediction of Thin Films via the Infrared Interference Method. Technologies. 2018; 6(4):122. https://doi.org/10.3390/technologies6040122
Chicago/Turabian StyleMpilitos, Christos; Amanatiadis, Stamatios; Apostolidis, Georgios; Zygiridis, Theodoros; Kantartzis, Nikolaos; Karagiannis, Georgios. 2018. "Development of a Transmission Line Model for the Thickness Prediction of Thin Films via the Infrared Interference Method" Technologies 6, no. 4: 122. https://doi.org/10.3390/technologies6040122