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Journal: Technologies, 2018
Volume: 6
Number: 122
122
Article: Development of a Transmission Line Model for the Thickness Prediction of Thin Films via the Infrared Interference Method
Authors: by Christos Mpilitos, Stamatios Amanatiadis, Georgios Apostolidis, Theodoros Zygiridis, Nikolaos Kantartzis and Georgios Karagiannis
Link: https://www.mdpi.com/2227-7080/6/4/122

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