Mpilitos, C.; Amanatiadis, S.; Apostolidis, G.; Zygiridis, T.; Kantartzis, N.; Karagiannis, G.
Development of a Transmission Line Model for the Thickness Prediction of Thin Films via the Infrared Interference Method. Technologies 2018, 6, 122.
https://doi.org/10.3390/technologies6040122
AMA Style
Mpilitos C, Amanatiadis S, Apostolidis G, Zygiridis T, Kantartzis N, Karagiannis G.
Development of a Transmission Line Model for the Thickness Prediction of Thin Films via the Infrared Interference Method. Technologies. 2018; 6(4):122.
https://doi.org/10.3390/technologies6040122
Chicago/Turabian Style
Mpilitos, Christos, Stamatios Amanatiadis, Georgios Apostolidis, Theodoros Zygiridis, Nikolaos Kantartzis, and Georgios Karagiannis.
2018. "Development of a Transmission Line Model for the Thickness Prediction of Thin Films via the Infrared Interference Method" Technologies 6, no. 4: 122.
https://doi.org/10.3390/technologies6040122
APA Style
Mpilitos, C., Amanatiadis, S., Apostolidis, G., Zygiridis, T., Kantartzis, N., & Karagiannis, G.
(2018). Development of a Transmission Line Model for the Thickness Prediction of Thin Films via the Infrared Interference Method. Technologies, 6(4), 122.
https://doi.org/10.3390/technologies6040122