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Journal: Electronics, 2020
Volume: 9
Number: 1723

Article: Investigation of Electrical Contacts to p-Grid in SiC Power Devices Based on Charge Storage Effect and Dynamic Degradation
Authors: by Meng Zhang, Baikui Li, Mengyuan Hua and Jin Wei
Link: https://www.mdpi.com/2079-9292/9/10/1723

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