Ha, S.; Lee, H.; Lee, W.-Y.; Jang, B.; Kwon, H.-J.; Kim, K.; Jang, J.
Effect of Annealing Environment on the Performance of Sol–Gel-Processed ZrO2 RRAM. Electronics 2019, 8, 947.
https://doi.org/10.3390/electronics8090947
AMA Style
Ha S, Lee H, Lee W-Y, Jang B, Kwon H-J, Kim K, Jang J.
Effect of Annealing Environment on the Performance of Sol–Gel-Processed ZrO2 RRAM. Electronics. 2019; 8(9):947.
https://doi.org/10.3390/electronics8090947
Chicago/Turabian Style
Ha, Seunghyun, Hyunjae Lee, Won-Yong Lee, Bongho Jang, Hyuk-Jun Kwon, Kwangeun Kim, and Jaewon Jang.
2019. "Effect of Annealing Environment on the Performance of Sol–Gel-Processed ZrO2 RRAM" Electronics 8, no. 9: 947.
https://doi.org/10.3390/electronics8090947
APA Style
Ha, S., Lee, H., Lee, W.-Y., Jang, B., Kwon, H.-J., Kim, K., & Jang, J.
(2019). Effect of Annealing Environment on the Performance of Sol–Gel-Processed ZrO2 RRAM. Electronics, 8(9), 947.
https://doi.org/10.3390/electronics8090947