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Electronics2019, 8(7), 749;https://doi.org/10.3390/electronics8070749

Journal: ElectronicsVolume: 8Number: 749

Article: Soft-Error Vulnerability Estimation Approach Based on the SET Susceptibility of Each Gate

Authors:
Fábio Batagin Armelin^1,2,3,*,
Lírida Alves de Barros Naviner¹ and
Roberto d’Amore²

Link: https://www.mdpi.com/2079-9292/8/7/749

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