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Journal: Electronics, 2019
Volume: 8
Number: 749
Article:
Soft-Error Vulnerability Estimation Approach Based on the SET Susceptibility of Each Gate
Authors:
by
Fábio Batagin Armelin, LÃrida Alves de Barros Naviner and Roberto d’Amore
Link:
https://www.mdpi.com/2079-9292/8/7/749
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