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Journal: Electronics, 2019
Volume: 8
Number: 445

Article: Area-Efficient Embedded Resistor-Triggered SCR with High ESD Robustness
Authors: by Fei Hou, Feibo Du, Kai Yang, Jizhi Liu and Zhiwei Liu
Link: https://www.mdpi.com/2079-9292/8/4/445

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