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Journal: Electronics, 2019
Volume: 8
Number: 445
Article:
Area-Efficient Embedded Resistor-Triggered SCR with High ESD Robustness
Authors:
by
Fei Hou, Feibo Du, Kai Yang, Jizhi Liu and Zhiwei Liu
Link:
https://www.mdpi.com/2079-9292/8/4/445
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