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Electronics 2019, 8(1), 62;

Maximal Q Factor for an On-Chip, Fuse-Based Trimmable Capacitor

Department of Computer Science, Electrical and Space Engineering, Luleå University of Technology, 971 87 Luleå, Sweden
Department of Physics, Imperial College, London SW7 2AZ, UK
Author to whom correspondence should be addressed.
Received: 3 October 2018 / Revised: 12 December 2018 / Accepted: 4 January 2019 / Published: 5 January 2019
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This paper presents a circuit for realising a fuse-programmable capacitor on-chip. The trimming mechanism is implemented using integrated circuit fuses which can be blown in order to lower the resulting equivalent capacitance. However, for integrated circuits, the non-zero fuse resistance for active fuses and finite fuse resistance for blown fuses limit the Q factor of the resulting capacitor. In this work, we present a method on how to arrange the fuses in order to achieve maximal worst-case Q factor for the given circuit topology given the process parameters and requirements on capacitance. We also analyse and discuss the accuracy and limitations of the topology with regard to fuse resistance and parasitic elements such as bond pads. View Full-Text
Keywords: fuse; resonant circuit; trimmable capacitor; single-chip fuse; resonant circuit; trimmable capacitor; single-chip

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This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited (CC BY 4.0).

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Nilsson, J.; Borg, J.; Johansson, J. Maximal Q Factor for an On-Chip, Fuse-Based Trimmable Capacitor. Electronics 2019, 8, 62.

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