Wang, Y.; Yuan, T.; Yang, Y.; He, M.; Wu, R.; Birman, K.P.
Accelerating Visual Anomaly Detection in Smart Manufacturing with RDMA-Enabled Data Infrastructure. Electronics 2025, 14, 2427.
https://doi.org/10.3390/electronics14122427
AMA Style
Wang Y, Yuan T, Yang Y, He M, Wu R, Birman KP.
Accelerating Visual Anomaly Detection in Smart Manufacturing with RDMA-Enabled Data Infrastructure. Electronics. 2025; 14(12):2427.
https://doi.org/10.3390/electronics14122427
Chicago/Turabian Style
Wang, Yifan, Tiancheng Yuan, Yuting Yang, Miao He, Richard Wu, and Kenneth P. Birman.
2025. "Accelerating Visual Anomaly Detection in Smart Manufacturing with RDMA-Enabled Data Infrastructure" Electronics 14, no. 12: 2427.
https://doi.org/10.3390/electronics14122427
APA Style
Wang, Y., Yuan, T., Yang, Y., He, M., Wu, R., & Birman, K. P.
(2025). Accelerating Visual Anomaly Detection in Smart Manufacturing with RDMA-Enabled Data Infrastructure. Electronics, 14(12), 2427.
https://doi.org/10.3390/electronics14122427