Zhang, L.; Fu, Z.; Guo, H.; Feng, Y.; Sun, Y.; Wang, Z.
TAFENet: A Two-Stage Attention-Based Feature-Enhancement Network for Strip Steel Surface Defect Detection. Electronics 2024, 13, 3721.
https://doi.org/10.3390/electronics13183721
AMA Style
Zhang L, Fu Z, Guo H, Feng Y, Sun Y, Wang Z.
TAFENet: A Two-Stage Attention-Based Feature-Enhancement Network for Strip Steel Surface Defect Detection. Electronics. 2024; 13(18):3721.
https://doi.org/10.3390/electronics13183721
Chicago/Turabian Style
Zhang, Li, Zhipeng Fu, Huaping Guo, Yan Feng, Yange Sun, and Zuofei Wang.
2024. "TAFENet: A Two-Stage Attention-Based Feature-Enhancement Network for Strip Steel Surface Defect Detection" Electronics 13, no. 18: 3721.
https://doi.org/10.3390/electronics13183721
APA Style
Zhang, L., Fu, Z., Guo, H., Feng, Y., Sun, Y., & Wang, Z.
(2024). TAFENet: A Two-Stage Attention-Based Feature-Enhancement Network for Strip Steel Surface Defect Detection. Electronics, 13(18), 3721.
https://doi.org/10.3390/electronics13183721