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Article

Test Platform for Developing Processes of Autonomous Identification in RFID Systems with Proximity-Range Read/Write Devices

by
Bartłomiej Wilczkiewicz
,
Piotr Jankowski-Mihułowicz
* and
Mariusz Węglarski
*
Department of Electronic and Telecommunications Systems, Rzeszów University of Technology, 35-959 Rzeszów, Poland
*
Authors to whom correspondence should be addressed.
Electronics 2023, 12(3), 617; https://doi.org/10.3390/electronics12030617
Submission received: 30 December 2022 / Revised: 19 January 2023 / Accepted: 24 January 2023 / Published: 26 January 2023

Abstract

The subject of a distributed RFID system with proximity-range read/write devices (RWD) is considered in this paper. Possible work scenarios were presented in the scope of industrial implementations and were then tested in a dedicated laboratory set. The development system is based on a high-frequency RWD integrated with a Wi-Fi microcontroller unit to create an Internet of things connected with a server (for data exchanging, user interface, etc.) via a wireless local area network. In practical applications, in order to increase the interrogation zone (IZ), there is a tendency to use one RWD with significant output power equipped with a multiplexer for managing several antennas located in the operational space. Such a solution is often economically unprofitable and even impossible to implement, especially in the case of the need to create the large IZ. Responding to market demand, the authors propose a distributed system developed on the basis of several cheap RFID reader modules and a few freely available hardware/software tools. They created the fully functional RFID platform and confirmed its usefulness in static and dynamic systems of object identification.
Keywords: RFID; MQTT; node-red; distributed RFID system; internet of things; wireless network RFID; MQTT; node-red; distributed RFID system; internet of things; wireless network

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MDPI and ACS Style

Wilczkiewicz, B.; Jankowski-Mihułowicz, P.; Węglarski, M. Test Platform for Developing Processes of Autonomous Identification in RFID Systems with Proximity-Range Read/Write Devices. Electronics 2023, 12, 617. https://doi.org/10.3390/electronics12030617

AMA Style

Wilczkiewicz B, Jankowski-Mihułowicz P, Węglarski M. Test Platform for Developing Processes of Autonomous Identification in RFID Systems with Proximity-Range Read/Write Devices. Electronics. 2023; 12(3):617. https://doi.org/10.3390/electronics12030617

Chicago/Turabian Style

Wilczkiewicz, Bartłomiej, Piotr Jankowski-Mihułowicz, and Mariusz Węglarski. 2023. "Test Platform for Developing Processes of Autonomous Identification in RFID Systems with Proximity-Range Read/Write Devices" Electronics 12, no. 3: 617. https://doi.org/10.3390/electronics12030617

APA Style

Wilczkiewicz, B., Jankowski-Mihułowicz, P., & Węglarski, M. (2023). Test Platform for Developing Processes of Autonomous Identification in RFID Systems with Proximity-Range Read/Write Devices. Electronics, 12(3), 617. https://doi.org/10.3390/electronics12030617

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