Test Platform for Developing Processes of Autonomous Identification in RFID Systems with Proximity-Range Read/Write Devices
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Wilczkiewicz, B.; Jankowski-Mihułowicz, P.; Węglarski, M. Test Platform for Developing Processes of Autonomous Identification in RFID Systems with Proximity-Range Read/Write Devices. Electronics 2023, 12, 617. https://doi.org/10.3390/electronics12030617
Wilczkiewicz B, Jankowski-Mihułowicz P, Węglarski M. Test Platform for Developing Processes of Autonomous Identification in RFID Systems with Proximity-Range Read/Write Devices. Electronics. 2023; 12(3):617. https://doi.org/10.3390/electronics12030617
Chicago/Turabian StyleWilczkiewicz, Bartłomiej, Piotr Jankowski-Mihułowicz, and Mariusz Węglarski. 2023. "Test Platform for Developing Processes of Autonomous Identification in RFID Systems with Proximity-Range Read/Write Devices" Electronics 12, no. 3: 617. https://doi.org/10.3390/electronics12030617
APA StyleWilczkiewicz, B., Jankowski-Mihułowicz, P., & Węglarski, M. (2023). Test Platform for Developing Processes of Autonomous Identification in RFID Systems with Proximity-Range Read/Write Devices. Electronics, 12(3), 617. https://doi.org/10.3390/electronics12030617

