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Journal: Electronics, 2021
Volume: 10
Number: 985
Article:
HEVC Fast Intra-Mode Selection Using World War II Technique
Authors:
by
Junaid Tariq, Ammar Armghan, Fayadh Alenezi, Amir Ijaz, Saad Rehman, Ayman Alfalou and Junaid Ali Khan
Link:
https://www.mdpi.com/2079-9292/10/9/985
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