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Journal: J. Low Power Electron. Appl., 2015
Volume: 5
Number: 101

Article: Impacts of Work Function Variation and Line-Edge Roughness on TFET and FinFET Devices and 32-Bit CLA Circuits
Authors: by , , , , and
Link: https://www.mdpi.com/2079-9268/5/2/101

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