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Journal: J. Low Power Electron. Appl., 2015
Article: Impacts of Work Function Variation and Line-Edge Roughness on TFET and FinFET Devices and 32-Bit CLA Circuits
Authors: by Yin-Nien Chen, Chien-Ju Chen, Ming-Long Fan, Vita Pi-Ho Hu, Pin Su and Ching-Te Chuang
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