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Journal: Journal of Low Power Electronics and ApplicationsVolume: 5Number: 101
Article: Impacts of Work Function Variation and Line-Edge Roughness on TFET and FinFET Devices and 32-Bit CLA Circuits
  • Authors:
  • Yin-Nien Chen*,
  • Chien-Ju Chen and
  • Ming-Long Fan
  • et al.
Link: https://www.mdpi.com/2079-9268/5/2/101

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