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Journal: J. Low Power Electron. Appl., 2014
Volume: 4
Number: 201

Article: Assessment of Global Variability in UTBB MOSFETs in Subthreshold Regime
Authors: by Sergej Makovejev, Babak Kazemi Esfeh, François Andrieu, Jean-Pierre Raskin, Denis Flandre and Valeriya Kilchytska
Link: https://www.mdpi.com/2079-9268/4/3/201

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