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Journal: J. Low Power Electron. Appl., 2011
Volume: 1
Number: 334
Article:
Error Detection and Recovery Techniques for Variation-Aware CMOS Computing: A Comprehensive Review
Authors:
by
Joseph Crop, Evgeni Krimer, Nariman Moezzi-Madani, Robert Pawlowski, Thomas Ruggeri, Patrick Chiang and Mattan Erez
Link:
https://www.mdpi.com/2079-9268/1/3/334
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