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Journal: J. Low Power Electron. Appl., 2011
Volume: 1
Number: 334
334-356
Article: Error Detection and Recovery Techniques for Variation-Aware CMOS Computing: A Comprehensive Review
Authors: by Joseph Crop, Evgeni Krimer, Nariman Moezzi-Madani, Robert Pawlowski, Thomas Ruggeri, Patrick Chiang and Mattan Erez
Link: https://www.mdpi.com/2079-9268/1/3/334

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