Order Article Reprints

Chen J, Huang X, Li Q, Fang Z, Ning H, Tao R, Liang H, Zhou Y, Yao R, Peng J. All-Sputtering, High-Transparency, Good-Stability Coplanar Top-Gate Thin Film Transistors. Applied Sciences. 2019; 9(1):83. https://doi.org/10.3390/app9010083

Chen, Jianqiu, Xiuqi Huang, Qunjie Li, Zhiqiang Fang, Honglong Ning, Ruiqiang Tao, Hongfu Liang, Yicong Zhou, Rihui Yao, and Junbiao Peng. 2019. "All-Sputtering, High-Transparency, Good-Stability Coplanar Top-Gate Thin Film Transistors" Applied Sciences 9, no. 1: 83. https://doi.org/10.3390/app9010083

Chen, J., Huang, X., Li, Q., Fang, Z., Ning, H., Tao, R., Liang, H., Zhou, Y., Yao, R., & Peng, J. (2019). All-Sputtering, High-Transparency, Good-Stability Coplanar Top-Gate Thin Film Transistors. Applied Sciences, 9(1), 83. https://doi.org/10.3390/app9010083