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Appl. Sci. 2015, 5(4), 1745-1755;

Enhancement Effects of the Terahertz Near-Field Microscopy

Chongqing Key Laboratory of Multi-scale Manufacturing Technology, Chongqing Institute of Green and Intelligent Technology, Chinese Academy of Sciences, Chongqing 400714, China
College of Instrumentation Science and Electrical Engineering, Jilin University, Changchun 130061, China
Authors to whom correspondence should be addressed.
These authors contributed equally to this work.
Academic Editor: Christoph Peter Hauri
Received: 12 October 2015 / Revised: 3 December 2015 / Accepted: 8 December 2015 / Published: 11 December 2015
(This article belongs to the Special Issue Frontiers in Terahertz Science and Technology)
PDF [1490 KB, uploaded 11 December 2015]


Terahertz near-field detection based and imaging on a nanotip has drawn wide attention following extensive applications of terahertz imaging technologies. Through the local enhanced electric field created by a terahertz nanotip in the near field, it is very likely to attain superior detection sensitivity and higher spatial resolution. This paper simulates the local enhancement effects of the terahertz near-field microscopy using a two-dimension finite difference time domain (2D-FDTD) method. Factors that influence the enhancement effects are investigated and analyzed in detail. Simulation results show that the size of the nanotip apex, the apex-substrate distance, dielectric properties of the substrate and the detected sample, etc., have significant impacts on the electric field enhancement and spatial resolution of the terahertz near-field nanotip, which can be explained from the effective polarizability of the nanotip-sample/substrate system. View Full-Text
Keywords: terahertz; nanotip; finite difference time domain; enhancement effect; effective polarizability; dielectric constant terahertz; nanotip; finite difference time domain; enhancement effect; effective polarizability; dielectric constant

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Huang, J.; Yang, Z.; Wei, D.; Du, C.; Cui, H.-L. Enhancement Effects of the Terahertz Near-Field Microscopy. Appl. Sci. 2015, 5, 1745-1755.

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