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Journal: Appl. Sci., 2022
Volume: 12
Number: 2230
Article:
Development of an On-Line Defect Detection System for EDM Process
Authors:
by
Yu-Ting Lyu, Chia-Ming Jan, Herchang Ay, Chiu-Feng Lin, Haw-Ching Yang, Min-Chun Chuang, Heng-Sheng Lin and Tsung-Pin Hung
Link:
https://www.mdpi.com/2076-3417/12/4/2230
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