Order Article Reprints

Kim SJ, Lee JJ, Lee YS, Yeom HJ, Lee HC, Kim J-H, You SJ. Computational Characterization of Microwave Planar Cutoff Probes for Non-Invasive Electron Density Measurement in Low-Temperature Plasma: Ring- and Bar-Type Cutoff Probes. Applied Sciences. 2020; 10(20):7066. https://doi.org/10.3390/app10207066

Kim, Si Jun, Jang Jae Lee, Young Seok Lee, Hee Jung Yeom, Hyo Chang Lee, Jung-Hyung Kim, and Shin Jae You. 2020. "Computational Characterization of Microwave Planar Cutoff Probes for Non-Invasive Electron Density Measurement in Low-Temperature Plasma: Ring- and Bar-Type Cutoff Probes" Applied Sciences 10, no. 20: 7066. https://doi.org/10.3390/app10207066

Kim, S. J., Lee, J. J., Lee, Y. S., Yeom, H. J., Lee, H. C., Kim, J.-H., & You, S. J. (2020). Computational Characterization of Microwave Planar Cutoff Probes for Non-Invasive Electron Density Measurement in Low-Temperature Plasma: Ring- and Bar-Type Cutoff Probes. Applied Sciences, 10(20), 7066. https://doi.org/10.3390/app10207066