Yang, C.; Wang, Y.; Putzky, D.; Sigle, W.; Wang, H.; Ortiz, R.A.; Logvenov, G.; Benckiser, E.; Keimer, B.; van Aken, P.A.
Ruddlesden–Popper Faults in NdNiO3 Thin Films. Symmetry 2022, 14, 464.
https://doi.org/10.3390/sym14030464
AMA Style
Yang C, Wang Y, Putzky D, Sigle W, Wang H, Ortiz RA, Logvenov G, Benckiser E, Keimer B, van Aken PA.
Ruddlesden–Popper Faults in NdNiO3 Thin Films. Symmetry. 2022; 14(3):464.
https://doi.org/10.3390/sym14030464
Chicago/Turabian Style
Yang, Chao, Yi Wang, Daniel Putzky, Wilfried Sigle, Hongguang Wang, Roberto A. Ortiz, Gennady Logvenov, Eva Benckiser, Bernhard Keimer, and Peter A. van Aken.
2022. "Ruddlesden–Popper Faults in NdNiO3 Thin Films" Symmetry 14, no. 3: 464.
https://doi.org/10.3390/sym14030464
APA Style
Yang, C., Wang, Y., Putzky, D., Sigle, W., Wang, H., Ortiz, R. A., Logvenov, G., Benckiser, E., Keimer, B., & van Aken, P. A.
(2022). Ruddlesden–Popper Faults in NdNiO3 Thin Films. Symmetry, 14(3), 464.
https://doi.org/10.3390/sym14030464