Chen, C.-L.; Shang, X.; Tsaur, W.-J.; Weng, W.; Deng, Y.-Y.; Wu, C.-M.; Cui, J.
An Anti-Counterfeit and Traceable Management System for Brand Clothing with Hyperledger Fabric Framework. Symmetry 2021, 13, 2048.
https://doi.org/10.3390/sym13112048
AMA Style
Chen C-L, Shang X, Tsaur W-J, Weng W, Deng Y-Y, Wu C-M, Cui J.
An Anti-Counterfeit and Traceable Management System for Brand Clothing with Hyperledger Fabric Framework. Symmetry. 2021; 13(11):2048.
https://doi.org/10.3390/sym13112048
Chicago/Turabian Style
Chen, Chin-Ling, Xin Shang, Woei-Jiunn Tsaur, Wei Weng, Yong-Yuan Deng, Chih-Ming Wu, and Jianfeng Cui.
2021. "An Anti-Counterfeit and Traceable Management System for Brand Clothing with Hyperledger Fabric Framework" Symmetry 13, no. 11: 2048.
https://doi.org/10.3390/sym13112048
APA Style
Chen, C.-L., Shang, X., Tsaur, W.-J., Weng, W., Deng, Y.-Y., Wu, C.-M., & Cui, J.
(2021). An Anti-Counterfeit and Traceable Management System for Brand Clothing with Hyperledger Fabric Framework. Symmetry, 13(11), 2048.
https://doi.org/10.3390/sym13112048