Order Article Reprints

Yao R, Fu X, Li W, Zhou S, Ning H, Tang B, Wei J, Cao X, Xu W, Peng J. Bias Stress Stability of Solution-Processed Nano Indium Oxide Thin Film Transistor. Micromachines. 2021; 12(2):111. https://doi.org/10.3390/mi12020111

Yao, Rihui, Xiao Fu, Wanwan Li, Shangxiong Zhou, Honglong Ning, Biao Tang, Jinglin Wei, Xiuhua Cao, Wei Xu, and Junbiao Peng. 2021. "Bias Stress Stability of Solution-Processed Nano Indium Oxide Thin Film Transistor" Micromachines 12, no. 2: 111. https://doi.org/10.3390/mi12020111

Yao, R., Fu, X., Li, W., Zhou, S., Ning, H., Tang, B., Wei, J., Cao, X., Xu, W., & Peng, J. (2021). Bias Stress Stability of Solution-Processed Nano Indium Oxide Thin Film Transistor. Micromachines, 12(2), 111. https://doi.org/10.3390/mi12020111