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Journal: Micromachines, 2019
Volume: 10
Number: 446
Article:
Effect of Annealing Temperature for Ni/AlOx/Pt RRAM Devices Fabricated with Solution-Based Dielectric
Authors:
by
Zongjie Shen, Yanfei Qi, Ivona Z. Mitrovic, Cezhou Zhao, Steve Hall, Li Yang, Tian Luo, Yanbo Huang and Chun Zhao
Link:
https://www.mdpi.com/2072-666X/10/7/446
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