2.1. Space-Based Infrared Detection Scenario Construction
Combining on-orbit infrared cloud images, we constructed an on-orbit cloud cluster database to store cloud shapes. Image processing and data enhancement techniques were used to increase cloud data diversity and improve dataset quality, as shown in
Figure 2.
Binary cloud maps were first obtained through threshold segmentation and set as
. Morphological reconstruction was used to fill inner holes in the binary cloud map, ensuring the integrity of cloud mass areas. The hole-filling structure was defined as
. Morphological closure was then applied to fill small gaps at the cloud mass edges, making the target area more coherent.
The morphological opening operation is used to eliminate isolated noise in images.
Subsequently, the erosion operation is applied to remove artifacts or interferences from the edges of cloud masses.
Finally, the connected region labeling algorithm was used to segment and label distinct cloud masses in the image, quantifying cloud regions to support mass segmentation and cloud cluster database construction. This study utilizes data from the QLSAT-2 and the New Technology Satellite to extract cloud information from multi-source on-orbit satellite images through morphological operations, thereby constructing an on-orbit cloud cluster database. This approach demonstrates versatility and is not dependent on specific satellite data sources.
As shown in Algorithm 1, we generate the cloud mask image based on the cloud cluster database. The initial parameters for cloud mask simulation images, such as CC rate and image size, were set based on the cloud cluster database. A cloud mask image was then simulated. A cloud mass was randomly selected from the database, and the target region was checked for emptiness (cloud-free). If the region was cloud-free, the selected cloud mass was overlaid and aligned in shape and position with the target region to avoid interference. This process generated randomized cloud mask simulation images for research and testing. If CC did not meet the required threshold, the overlay process was repeated; otherwise, the current image was output as the final cloud mask simulation result.
Algorithm 1: Cloud Mask Generation Process |
![Remotesensing 17 02900 i001 Remotesensing 17 02900 i001]() |
After completing the morphological construction of cloud layers, we superimpose the cloud mask image onto the sea surface generated by PM wave spectrum simulation, thereby constructing the space-based infrared detection scenario.
2.2. Calculation of Space-Based Infrared Radiation Characteristics
First, the total radiance of the space-based infrared background can be calculated as follows:
where
is the atmospheric transmittance,
T represents the temperature in Kelvin (K),
represents the emissivity,
represents the wavelength,
is the spectral radiant emittance, and
is the the atmospheric path radiance. Both
and
are calculated using the Modtran 5.0 software. The reflected solar radiation from the background is calculated as follows:
where
is the surface reflectivity,
is the solid angle subtended by solar radiation reaching the detector background, and
is the solar radiance. The incidence zenith angle (
), reflection zenith angle (RZA) (
), incidence azimuth angle (
), and reflection azimuth angle (
) are also used in the calculation.
The infrared radiation of an aircraft target includes contributions from the engine exhaust plume and the airframe. The plume emits radiation based on its temperature, emissivity, and projected area, while the airframe’s radiation accounts for both its own thermal emission and reflected solar radiation (due to high-reflectivity coatings). The total infrared radiation of the target is the sum of these two components, following the theoretical models and parameter definitions detailed in [
4].
2.3. Digital Imaging Simulation and Generation
After calculating the target radiation intensity and background radiance, we perform a digital simulation of the infrared imaging payload. To achieve high-fidelity infrared image generation, a physical conversion model is established to transform radiation signals into grayscale images. Focusing on photoelectric conversion characteristics, we developed a theoretical model framework for electron counts. (1) The target infrared signal electron count model characterizes the detector’s quantized response to target radiation; (2) the background irradiation electron count model quantifies environmental radiation interference; (3) the noise electron count model describes the detection system’s inherent noise characteristics. Through coupled multi-physics field calculations involving these models, we developed an infrared image numerical simulation method that spans radiation transmission, photoelectric conversion, and noise interference, forming a foundation for evaluating and optimizing subsequent imaging systems.
Due to infrared detection limitations and long-distance imaging, space targets typically appear as diffuse point sources characterized by a Gaussian point spread function (PSF). The energy concentration (EC) of a target, defined as the ratio of energy within a single pixel to the total energy distributed by the PSF, is another key characteristic [
48]. To ensure spatial consistency, cloud clusters were extracted from on-orbit infrared images, rescaled to match the detector’s focal plane, and overlaid onto sea surface radiance simulated using the PM model, followed by spatial resampling to align with the sensor pixels. For point targets, a Gaussian PSF with an energy concentration coefficient modeled sub-pixel radiance spreading, reflecting the sensor’s optical response. Key detector and optical parameters, including focal length, entrance pupil diameter, and F-number, were incorporated into a pinhole camera model to accurately map scene radiance to pixel locations. This procedure ensured that the simulated radiance distribution aligned with the sensor’s field of view, providing reliable support for target detection and radiometric inversion.
The number of electrons generated by a detector element in response to the received target energy is given by
where
is Planck’s constant and
is the speed of light. Detector-specific parameters include the operational central wavelength
, integration time
, and quantum efficiency
, representing the photoelectron conversion rate. Transmission path components include altitude-dependent atmospheric transmittance
, optical transmittance
, and the effective entrance pupil diameter
D. The target spectral radiant intensity is
, and
H is the detection range.
The number of electrons generated by the background radiation can be expressed by
where
represents the background radiance,
is the F-number, and
represents the pixel size.
The total noise electrons
are defined as the number of electrons accumulated on the integration capacitor by the end of when the output signal equals the root mean square (RMS) noise voltage. These electrons are contributed by several noise sources, which are listed in
Table 1. Photon noise
represents the RMS pixel noise due to signal, background, and dark current (units of e-/pixel). Temporal noise includes readout noise
, the RMS of pixel readout noise (units of e-/pixel). Spatial noise sources include response non-uniformity
, dark current non-uniformity noise (e-/pixel), and dark current non-uniformity
, representing the RMS of pixel dark current non-uniformity noise (e-/pixel). In subsequent sections,
N refers to the number of electrons in a pixel, while
n denotes the RMS distribution of noise per pixel [
4].
Photon noise refers to fluctuations in the rate at which background photons reach the detector’s sensitive elements. It sets the fundamental limit on the noise performance of photon detectors.
represents the RMS of all photon-related noise and can be decomposed by the radiation source as follows:
here,
represents the optical instrument background noise, which is the sum of contributions from various components in the optical system, including the Dewar window radiation. Its mathematical expression is
where
denotes the number of near-field radiation electrons generated by optical elements at their working temperatures
, and
is the instrument background irradiance (
) from those elements. The
comes from the dark current of the infrared detector and is positively correlated with the integration time. It is calculated as follows:
where
is the dark current density per unit area, with the unit of
.
Readout noise is an additive temporal noise generated in the readout circuitry of the focal plane. It primarily arises from thermal noise produced by the resistance of the reset switch during conduction. The noise voltage across the integrating capacitor
is
where
is the reset switch,
is the junction temperature of the diode, and
is the integrating capacitor.
Therefore, the number of readout noise electrons is
Noise caused by response non-uniformity is classified as multiplicative noise and differs from dark current non-uniformity in that it is proportional to the exposure level. Variations in pixel quantum efficiency, uneven projection across window regions, focal plane array (FPA) structure, and wafer processing all contribute to pixel response rate non-uniformity within the FPA. The noise electrons from response non-uniformity are calculated as follows:
where
is the response non-uniformity coefficient.
Additive noise from dark current non-uniformity is independent of the exposure level and is a primary noise source in low-contrast images. The direct current through the p–n junction comprises two components: the photovoltaic diode dark current and photocurrent. Under illumination, monochromatic background radiation induces photocurrent on the photosensitive surface. In darkness, the photovoltaic diode exhibits only dark current, which becomes negligible under zero bias. The noise from dark current non-uniformity is a fixed-pattern additive noise, particularly significant in dark scenes. The number of corresponding noise electrons is calculated as follows:
where
is the non-uniformity coefficient of the dark current.
The total number of noise electrons is
The digital number (DN) of each image pixel is computed from the number of electrons from the target, background, and noise. The target pixel grayscale value
is calculated as
where
denotes the full well capacity of a single pixel’s integrating capacitor,
is the bit of electronic quantization (typically 8 to 16 bits), and
is the mean grayscale value of background noise, given by
The total noise grayscale
is expressed in
and is modeled as Gaussian white noise. It is superimposed onto the N×N infrared image as
Sensors located in different columns of the infrared focal plane array use distinct readout circuits, and variations in their bias voltages produce stripe noise—manifesting as alternating bright and dark bands, typically in horizontal or vertical orientations [
49]. Stripe noise is a common image artifact. We simulate non-periodic additive stripe noise using the following degradation model:
where
S is the additive stripe component. Stripe noise is superimposed onto the image using signal flow summation, which more accurately reflects the practical non-uniformity switching conditions found in infrared payload systems.