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Article

Charge Transport Enhancement in BiVO4 Photoanode for Efficient Solar Water Oxidation

Shenzhen Key Laboratory of Advanced Thin Films and Applications, Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen 518060, China
*
Authors to whom correspondence should be addressed.
Materials 2023, 16(9), 3414; https://doi.org/10.3390/ma16093414
Submission received: 3 April 2023 / Revised: 24 April 2023 / Accepted: 25 April 2023 / Published: 27 April 2023
(This article belongs to the Special Issue Novel Nanostructured Materials for Optoelectronic Applications)

Abstract

:
Photoelectrochemical (PEC) water splitting in a pH-neutral electrolyte has attracted more and more attention in the field of sustainable energy. Bismuth vanadate (BiVO4) is a highly promising photoanode material for PEC water splitting. Additionally, cobaltous phosphate (CoPi) is a material that can be synthesized from Earth’s rich materials and operates stably in pH-neutral conditions. Herein, we propose a strategy to enhance the charge transport ability and improve PEC performance by electrodepositing the in situ synthesis of a CoPi layer on the BiVO4. With the CoPi co-catalyst, the water oxidation reaction can be accelerated and charge recombination centers are effectively passivated on BiVO4. The BiVO4/CoPi photoanode shows a significantly enhanced photocurrent density (Jph) and applied bias photon-to-current efficiency (ABPE), which are 1.8 and 3.2 times higher than those of a single BiVO4 layer, respectively. Finally, the FTO/BiVO4/CoPi photoanode displays a photocurrent density of 1.39 mA cm−2 at 1.23 VRHE, an onset potential (Von) of 0.30 VRHE, and an ABPE of 0.45%, paving a potential path for future hydrogen evolution by solar-driven water splitting.

1. Introduction

The production of hydrogen through solar-driven water splitting typically stores solar energy in chemical bonds, which is a potential strategy for overcoming shortages of energy and related global environmental problems [1,2,3,4,5]. The characteristics of photoanode materials decide the solar-to-hydrogen (STH) efficiency of a photoelectrochemical (PEC) device, because the kinetic demand of oxygen evolution reaction (OER) in the PEC water-splitting procedure is higher than the hydrogen evolution reaction (HER) [6,7,8]. To date, various neutral electrolytes have been studied to function as PEC photoanodes, such as TiO2 [9,10], Fe2O3 [11], WO3 [12], and BiVO4 [13,14,15,16,17,18]. Among them, the monoclinic bismuth vanadate (BiVO4) has received significant attention because of its favorable band-edge positions, its moderate band gap energy (Eg, 2.4–2.5 eV) [19], low cost, etc. However, the surface charge recombination and severe bulk defect delay the OER kinetics limits PEC performance [20]. BiVO4 photoanodes have been the subject of numerous studies aimed at enhancing their PEC performance, including doping [21], building heterojunction [22], crystal facet or morphology engineering [23], oxygen vacancies (Ov) introduction, and the surface modification of oxygen evolution catalysts (OECs), etc. [24,25].
The surface modification of oxygen evolution catalysts is a more promising method for enhancing the PEC performance of BiVO4 photoanodes than its other counterparts, due to the effective passivation of the surface charge recombination centers and improving the interfacial OER kinetics for PEC water oxidation. For instance, J. Hu et al. successfully synthesized iron oxhydroxide (FeOOH) with different crystalline phases (α-, β-, and δ-) through a regulated solvothermal pathway, where the electrocatalytic OER activity of β-FeOOH was highest [26]. Carbon quantum dots (CQDs) are also able to remarkably improve electrocatalytic OER activity owing to the increased Ov density; at the same time, they can form heterojunctions with semiconductors, thereby effectively promoting charge separation and transport [27]. Moreover, L. Wu et al. synthesized the nickel boride (NiB) layer by adjusting the composition of the neutral electrolyte. The borates with B-O bonds become promoters of catalyst activity by accelerating proton-coupled electron transfer and interact with Ni2+ ions to inhibit charge recombination on BiVO4 surface, thereby reporting a Jph of 6.0 mA cm−2 at 1.23 VRHE [14]. Cobaltous phosphate (CoPi) is an effective electrocatalyst for water oxidation and was first reported by G. Nocera and W. Kanan, who also demonstrated that hydrogen phosphate ions are proton acceptors in oxygen production reactions under neutral pH conditions [28]. Moreover, J. Durrant et al. discussed the oxidation degree of the CoPi catalyst on the BiVO4 photoanode under simulated sunlight irradiation and determined the appropriate degree of catalyst oxidation to drive substantial water oxidation. Additionally, the relative kinetics of water oxidation on the surfaces of electrocatalyst and semiconductor and the kinetics of holes transfer to electrocatalysts were discussed for the first time [18].
In this work, a BiVO4 thin film was initially fabricated, which is inherently beneficial for charge transport through the adjustment the electrodeposition time of the BiOI precursor film and the dropping of excessive vanadium source solution for annealing in a muffle furnace. Then, the cobaltous phosphate (CoPi) layer was electrodeposited on optimal BiVO4 electrodes while the composition of neutral electrolyte was regulated by adding cobaltous nitrate and phosphate species. Finally, the FTO/BiVO4/CoPi photoanode was successfully prepared. Combining the electrocatalytic and photoelectric technologies, the CoPi for OER catalytic activity was investigated in detail and notable results were obtained, e.g., a Jph of 1.39 mA cm−2 (at 1.23 VRHE) and an undoped ABPE of 0.45% under AM 1.5 G illumination.

2. Materials and Methods

2.1. Preparation of BiOI Precursor Film

The BiOI precursor film was electrodeposited on an FTO glass substrate with an effective area of 1.5 cm × 2 cm in a three-electrode system, where a Pt-foil was used as the counter electrode and an Ag/AgCl with saturated KCl solution was used as the reference electrode. The BiOI precursor deposition solution was fabricated by dissolving lactic acid (0.03 M), KI (0.4 M), and Bi(NO3)3·5H2O (0.015 M) in deionized water (100 mL), with 1,4-Benzoquinone (0.046 M) in ethanol (40 mL) solution. The pH of the mixed solution was adjusted to 3.7 by adding 0.1 M nitric acid aqueous solution after stirring for 20 min. Initially, a 60 s deposition was conducted at −0.40 VAg/AgCl to prevent the falling off of BiOI films from the surface of the FTO substrate. After the initial deposition, the BiOI film was obtained at a constant voltage of −0.25 VAg/AgCl with different deposition durations, then rinsed thoroughly with deionized water and dried in a drying oven.

2.2. Preparation of BiVO4 Electrode

The vanadium source solution was prepared by dissolving VO(acac)2 (0.5 M) in dimethylsulfoxide (10 mL). The as-prepared BiOI precursor film was dropped into the superfluous vanadium source solution. The electrode was then shifted to a muffle furnace and annealed for about 12 h. The heating rate was 3 °C/min to 120 °C, 0.67 °C/min to 280 °C, and 1.41 °C/min to 450 °C, and then held at 450 °C for 1 h. All the annealing processes ended with furnace cooling. After annealing, the electrodes were immersed in a 1.0 M NaOH solution for 15 min with gentle stirring to wash off the V2O5 on the BiVO4 surface. The prepared BiVO4 electrodes were rinsed thoroughly with deionized water and dried in a drying oven.

2.3. Photo-Assisted Electrodeposition of CoPi Cocatalyst

The CoPi cocatalyst was electrodeposited on the BiVO4 electrode under AM 1.5 G simulated sunlight by using the three-electrode system containing the solutions of NaH2PO4 (0.1 M), Na2HPO4 (0.1 M), Co(NO3)2·6H2O (0.001 M), and deionized water (100 mL). Similarly, an Ag/AgCl with a saturated KCl solution was used as the reference electrode and a Pt-foil as the counter electrode. The deposition voltage and time were −0.40 VAg/AgCl and 90 s, respectively.

2.4. Characterizations

The crystallinity and structure of BiVO4 films were examined by X-ray diffraction (XRD, Ultima-iv with Cu/Kα radiation). Surface morphologies were observed via scanning electron microscope (SEM, Germany Zeiss SUPRA 55). The transmittance and absorption of BiVO4 films were measured via a Shimadzu UV-3600 spectrophotometer. Ultraviolet photoelectron spectroscopy (UPS) was performed using a PHI 5000 VersaProbe with an energy value of a He I source with 21.22 eV. The PEC performance was obtained by using the CHI 660E electrochemical workstation under a three-electrode system, where an Ag/AgCl with saturated KCl solution was used as the reference electrode, with Pt-foil as the counter electrode and the BiVO4 photoanode as the working electrode. Photoelectrochemical impedance spectroscopy (PEIS) was assessed under light conditions, and its frequency ranged from 10−1 Hz to 105 Hz. Mott–Schottky (M-S) measurements were used to calculate the flat band potential (Efb) of the BiVO4 films and the analysis of defects in junctions formed at the interface of semiconductor electrolytes.

3. Results and Discussion

BiVO4 film with different thicknesses can be prepared by adjusting the electrodeposition time of the BiOI precursor film, i.e., the BiOI-1 precursor film deposited at 300 s, BiOI-2 at 330 s, and BiOI-3 at 360 s, respectively, and then dropping excessive vanadium source solution to anneal in muffle furnace. The resulting BiVO4 films were labeled as BiVO4-1, BiVO4-2, and BiVO4-3, and the corresponding thicknesses were 358.5 nm, 424.3 nm, and 485.6 nm, respectively (Figure S1). The X-ray diffraction (XRD) patterns of BiVO4 film with three different thicknesses are shown in Figure 1a. The existence of three major diffraction peaks (011), (–121), and (040) and the standard monoclinic BiVO4 (JCPDS Card No.14-0688) peaks without any extra peaks, confirm the high crystallinity and pureness of the as-fabricated BiVO4 thin films [1]. Figure 1b shows that the smaller FWHM (full width at half maxima) values of different diffraction peaks demonstrate larger crystal grains in the BiVO4-2 film. The grain size can also be calculated according to the Scherrer formula [29]:
D = K λ β c o s θ
where K is the Scherrer constant, λ is the wavelength of the X-ray sources (0.15406 nm), D is crystallite size (nm), β is the FWHM value, and θ is the Bragg angle at peak position. Figure 1c displays the proportion diagram of grain size distribution, and the BiVO4-2 obviously accounts for a large proportion in areas with a large grain size distribution. In addition, the average grain sizes of BiVO4-1, BiVO4-2, and BiVO4-3 are 15.54, 16.28, and 15.51 nm, respectively. The surface scanning electron microscopy (SEM) images of the BiVO4-1, BiVO4-2, and BiVO4-3 films are shown in Figure 1d–f. It can be seen that Figure 1e depicts larger crystalline grains compared to those of BiVO4-1 (Figure 1d). The BiVO4-1 film consists of many small grains with obvious voids on their surfaces, which are not conducive to charge transport, possibly due to the increase in charge recombination centers on the BiVO4-1 film surface. On the other hand, a quasi-uniform BiVO4-2 film with large grains can be obtained by increasing the deposition time of the BiOI precursor film, which is directly related to its effective thermodynamic/kinetic growth under a sufficient annealing temperature. However, the BiVO4-3 film shows a stacked structure and more voids than the BiVO4-2 film as the deposition time of the precursor film increases (Figure 1f). Therefore, highly compact and quasi-uniform BiVO4-2 films are better for photo-assisted electrodeposition with a CoPi catalyst.
The energy band gap (Eg) of the BiVO4 semiconductor was gained from the transmission spectra in the wavelength range of 300 nm to 1500 nm, as shown in Figure 2a. The transmittance value of the BiVO4-2 film is lower than that of the BiVO4-1 and BiVO4-3 films, indicating that it has a higher absorbance. The FTO was used as a substrate, and the Eg value was calculated using the equations below [30]:
α = ln 1 / T / d
α h v = C ( h v E g ) n
where n is an index equal to 0.5 in a direct band-gap semiconductor, d is the thickness of the BiVO4 film, T is the transmission, is the energy of a photon, α is the absorption coefficient, and C is a constant. The BiVO4 films with three different thicknesses display a similar Eg value of 2.41 eV (Figure 2b). The energy band information of the BiVO4 film was calculated via ultraviolet photoelectron spectroscopy (UPS), as we can see in Figure 2c. According to the secondary electron cut-off (SEC) edge and valence band (VB) position, the work function (Φ) of BiVO4 was calculated as 5.57 eV [31]; meanwhile, the EF and EV are determined as −5.57 eV and −7.23 eV, respectively (Supplementary Materials, Note S1). In combination with its optical band gap (Eg), at a value of 2.41 eV, the conduction band (EC, vs. vacuum) of the BiVO4 semiconductor can be obtained, and its value is –4.82 eV.
The photocurrent density potential (J-V) curves of pure BiVO4 photoanodes with different thicknesses corresponding to the differing BiVO4/CoPi photoanodes are shown in Figure 2d. It can be seen that the BiVO4-2 photoanodes are significantly superior to other BiVO4 photoanodes, indicating that the BiVO4 film with the fewest charge recombination centers was obtained by adjusting the electrodeposition time of the BiOI precursor film and the annealing temperature. In addition, we can also see that the Jph and the fill factor of all BiVO4 photoanodes increased after CoPi catalyst surface modification. Of these, the BiVO4-2/CoPi photoanode has a maximum Jph value of 1.39 mA cm−2. Therefore, BiVO4-2 with optimal thickness was selected in this work in order to study the effect of CoPi catalyst on OER occurrence and PEC performance. The potential relative to the Ag/AgCl reference electrode (VAg/AgCl) can be converted into VRHE using the Nernst equation [32]:
V R H E = V A g / A g C l + 0.059 × P H + 0.198
while ABPE was obtained from the J-V response of the photoanodes according to the following equation [33]:
A B P E % = J p h × V R H E V H 2 O / O 2 / P s u n × 100 %
where VRHE is the potential relative of a relative hydrogen electrode (RHE), V H 2 O / O 2 is the oxidation potential for oxygen (1.23 VRHE), and Psun is the simulated sunlight intensity (100 mW/cm2). The electrocatalytic OER activities of BiVO4 and BiVO4/CoPi electrodes were measured by linear sweep voltammetry (LSV) tests in 0.2 M Na2HPO4/NaH2PO4 solution (pH = 6.5) under dark conditions. Figure 3a depicts the LSV curves with a 100% iR drop compensation and a 0.1 mV s−1 scanning rate of the OER catalysts. In general, a catalyst’s OER activity is typically evaluated based on its overpotential at a current density of 10 mA cm−2 [27]. Therefore, the BiVO4/CoPi displays the overpotential value of 0.99 VRHE, which is smaller than that of BiVO4 (1.87 VRHE) at 10 mA cm−2 and the Tafel slope of BiVO4/CoPi (106.0 mV dec−1) is also obviously lower than that of BiVO4 (265.7 mV dec−1), indicating that the CoPi catalyst is able to drive reactions at lower overpotentials and play an excellent role in BiVO4 surface modification (Figure 3b,c). Moreover, the chopped J-V curves are relevant to photoanodes in the dark and continuous illumination within a lesser potential range (<1.5 VRHE) and are shown in Figure 3d. The dark current density is very low (~0 mA cm−2 at 1.23 VRHE); hence, under AM 1.5 G simulated sunlight illumination, the photocurrent density of BiVO4 and BiVO4/CoPi photoanodes increases sharply, confirming the rapid photo-generated carrier generation, separation, and transport, without the need for excess drive potentials. The J-V curves based on BiVO4 and BiVO4/CoPi photoanodes are displayed in Figure 3e. Specifically, the Jph values at 1.23 VRHE are determined to be 0.75 mA cm−2 and 1.39 mA cm−2 in sequence. Furthermore, Figure 3f exhibits the as-calculated ABPE and the BiVO4/CoPi photoanode (0.45%) is about ~3 times higher than the BiVO4 photoanode (0.14%), indicating a simultaneous upgrade in PEC performance.
The charge transport kinetics were explored according to the electrochemical impedance test. Figure 4a,b exhibits the photoelectrochemical impedance spectroscopy (PEIS) characterization of the BiVO4 and BiVO4/CoPi photoanodes under illumination. The equivalent circuit is shown in Figure 4a; RW can be attributed to the resistance of the electrolyte solution, and Rct and Csc represent the charge transport resistance and capacitance in the space charge region of the electrode/electrolyte interface. The fitted results are shown in Table 1, the chi-square values of the BiVO4 and BiVO4/CoPi photoanodes are both less than 0.02, and we can also see that the raw data and the fitted results match well (Figure 4a). Similar RW values (18.2–18.8 Ω) indicate the stability of the test environment, and the remarkably smaller Rct value of the BiVO4/CoPi photoanode (137.9 Ω) implies a more effective charge transport at the electrode/electrolyte interface. The larger Csc value of the BiVO4/CoPi photoanode (5.20 × 10−4 F) indicates that the ability of the charge collection is strengthened. Generally, the PEIS-derived low-frequency region (10−1~101 Hz) normally represents the mass transfer reactions in the electrode/electrolyte interface [34]. As shown in Figure 4b, the reduction of interface impedance (|Z|) also proves that the CoPi catalyst accelerates the mass transfer process. Moreover, the peaks in the Bode diagrams for the BiVO4 photoanode are located at low frequencies (10−1~101 Hz), while the BiVO4/CoPi photoanode is located between 101 and 102 Hz (insert in Figure 4b). The rapid response of the BiVO4/CoPi photoanode to frequency indicates that charge transport and mass transfer simultaneously accelerated. The Mott–Schottky (M-S) measurement was also introduced in order to study the junction formed at the semiconductor–electrolyte interface in reaction to the applied potential (VAg/AgCl, i.e., the aforementioned Eappl). Figure 4c reveals that the 1/C2 increases with the potential VAg/AgCl in the presence of the space charge region (SCR), indicating n-type properties for the BiVO4 semiconductor. Moreover, the conduction band position of BiVO4 semiconductor relative to normal hydrogen electrode (NHE) can be obtained from the flat band potential (Efb), donor density (ND), the effective density of states functions in the conduction band (Nc), and the effective mass of the electron ( m n * ), according to the following equations [35,36]:
1 C s c 2 = 2 e A 2 ε ε 0 N D ( E a p p l E f b k B T e )
E c ( v s . N H E ) = E f b + k T l n ( N c N D )
N c = 2 ( 2 π m n * k T h 2 ) 3 2
where Csc is the SCR capacitance in the semiconductor–electrolyte interface, A is the active device area, ε0 is the permittivity of vacuum, ε is the relative dielectric coefficient, kB is Boltzmann constant, e is the unit charge, and T represents the temperature. The Efb value and ND value of the BiVO4 are 0.38 VNHE and 1.92 × 1021 cm−3, respectively. At room temperature (T = 25 °C), the vacuum energy level can be converted to VNHE by the following formula [37,38]:
E n e r g y ( v s . v a c u u m ) = e E a p p l v s . N H E 4.44   e V
The calculated EC value range is –4.82 ± 0.02 eV, using the above equations, which is consistent with the EC of –4.82 eV obtained from the UPS measurement. According to the Eg value (2.41 eV) calculated by transmission, the valance band (EV, vs. NHE) is 2.79 VNHE, which thermodynamically supports the occurrence of water oxidation with oxygen production by solar-driven water splitting. In contrast, the Efb value and ND value of the BiVO4/CoPi quasi-semiconductor are 0.40 VNHE and 8.87 × 1020 cm−3, respectively (Figure 4d). The lower ND value demonstrates that the CoPi catalyst passivates defects (e.g., charge recombination centers) on the BiVO4 film surface, reducing electron–hole recombination during charge transport to the electrode/electrolyte interface, thereby improving photocurrent density. We can also clearly observe that the CoPi catalyst effectively reduces the defect pinholes on the BiVO4 surface through a top-view SEM image of the BiVO4/CoPi photoanode (Figure S2). The increase in Efb of 0.02 VNHE also indicates that the BiVO4/CoPi photoanode is more beneficial for water oxidation in thermodynamics (Figure S3).
The surface charge transfer efficiency (ηtran) and bulk charge separation efficiency (ηsep) of the BiVO4 photoanode were further investigated in order to determine the reasons for the significantly improved photocurrent density after surface modification with CoPi catalyst. The integrated photocurrent density (Jabs) of BiVO4 and BiVO4/CoPi photoanodes can be obtained according to wavelength-dependent light harvesting efficiency (LHE) and the standard AM 1.5 G solar spectrum, utilizing the following formulas [1]:
J a b s = 300 λ e λ 1240 · N p h ( λ ) · L H E ( λ ) d λ
L H E = 1 10 A ( λ )
where Jabs is the integrated photocurrent density, λe is the absorption cut-off wavelength that is linked to the band gap, Nph (λ) is the photo flux, and A (λ) is the wavelength-dependent absorption, covering wavelengths from 350 to 800 nm (Figure 5a). The λe values for BiVO4 and BiVO4/CoPi were determined to be at 514 nm and 520 nm, suggesting CoPi can also effectively broaden and heighten the LHE range of the BiVO4 photoanode (Figure 5b), and giving the Jabs values of 6.29 mA cm−2 and 6.68 mA cm−2, respectively (Figure 5c). Moreover, the transient photocurrent response spectra of the BiVO4 and BiVO4/CoPi photoanodes are shown in Figure 5d, while the ηtran can be obtained through the measured photocurrents associated with the “light off” state and the “light on” state, according to the following formulas [32]:
η t r a n = J s s J i n s t
where Jss is the photocurrent density in steady state and Jinst signifies the instantaneous photocurrent density. Accordingly, the ηtran value of the BiVO4/CoPi photoanode (82.1%) has increased in comparison to the BiVO4 photoanode (76.0%), demonstrating that the CoPi catalyst accelerates holes transfer to the electrode/electrolyte interface and then oxidizes water. Moreover, we can observe in Figure 5d that the BiVO4/CoPi photoanode has a spike peak in the “light off” state compared with the BiVO4 photoanode. The negative current transient suggests that there is significant back electron/hole recombination after “light off” [39], reiterating that the BiVO4/CoPi photoanode has a larger capacitance value (Table 1), which demonstrates that the CoPi catalyst can delay charge recombination and promote the OER’s continuous progress. Additionally, the ηsep can be calculated using following equation [32]:
η s e p = J p h J a b s × η t r a n
The BiVO4 and BiVO4/CoPi photoanodes’ calculated ηsep values are 15.7%, and 25.4%, respectively. The obvious improvement of the ηsep value indicates that the CoPi catalyst is also conducive to promoting the rapid separation of electron–hole pairs in the BiVO4 body.

4. Conclusions

In summary, a highly compact and quasi-uniform BiVO4 film was obtained at a suitable electrodeposition time and annealing temperature. After the successful electrodeposition of the CoPi catalyst on the optimized BiVO4 electrode, the FTO/BiVO4/CoPi photoanodes were fabricated, and their PEC performances were systematically investigated. Due to the surface modification of the CoPi catalyst, i.e., passivating charge recombination centers on the BiVO4 surface and promoting the separation of electron–hole pairs in the BiVO4 body, the interface impedance (|Z|) of the mass transfer process was decreased, while significantly enhancing the ηtran value of 82.1% and ηsep value of 25.4%. The Jph and ABPE of the BiVO4 photoanode were increased by about ~2 times and ~3 times, respectively, demonstrating that the CoPi catalyst can accelerate holes transfer from the BiVO4 semiconductor to the catalyst in order to be competitive with water oxidation by holes in the semiconductor and to improve PEC performance. The results of this study may open up the possibility for the future design and construction of extremely effective photoanodes for solar-driven water splitting.

Supplementary Materials

The following supporting information can be downloaded at: https://www.mdpi.com/article/10.3390/ma16093414/s1, Figure S1: Cross-sectional SEM images of the (a) BiVO4-1, (b) BiVO4-2, and (c) BiVO4-3 film; Figure S2: Top-view SEM image of the BiVO4/CoPi photoanode; Figure S3: The energy levels schematic diagram of the BiVO4 and BiVO4/CoPi photoanodes; Supplementary Note S1. UPS analysis.

Author Contributions

Z.L., Z.X. and W.L. contributed equally to this work. Conceptualization, G.L. and S.C.; methodology, Z.L., Z.Z. and Z.S.; validation, P.F.; formal analysis, H.S.A., M.A., G.L. and S.C.; investigation, Z.L., Z.X. and W.L.; writing—original draft preparation, Z.L., Z.X. and W.L.; writing—review and editing, H.S.A., G.L. and S.C.; visualization, P.F.; supervision, G.L. and S.C.; funding acquisition, G.L. and S.C. All authors have read and agreed to the published version of the manuscript.

Funding

This work was supported by National Natural Science Foundation of China (No. 62104156); Guangdong Basic and Applied Basic Research Foundation (2022A1515010979, 2023A1515011256), China; Science and Technology plan project of Shenzhen (20220808165025003, 20200812000347001), China.

Institutional Review Board Statement

Not applicable.

Informed Consent Statement

Not applicable.

Data Availability Statement

The data presented in this study are available on request from the corresponding authors.

Conflicts of Interest

The authors declare no conflict of interest.

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Figure 1. (a) XRD patterns; (b) full width at half maxima of different diffraction peaks; (c) grain size; and (df) surface SEM pictures of the BiVO4 films with different thicknesses.
Figure 1. (a) XRD patterns; (b) full width at half maxima of different diffraction peaks; (c) grain size; and (df) surface SEM pictures of the BiVO4 films with different thicknesses.
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Figure 2. (a) Transmission spectra; (b) plots of (αhv)2 versus energy; (c) UPS characterizations deriving the SEC edge and the VB position of BiVO4 film; and (d) J-V curves of the BiVO4 photoanodes with different thicknesses corresponding to differing BiVO4/CoPi photoanodes under sunlight illumination.
Figure 2. (a) Transmission spectra; (b) plots of (αhv)2 versus energy; (c) UPS characterizations deriving the SEC edge and the VB position of BiVO4 film; and (d) J-V curves of the BiVO4 photoanodes with different thicknesses corresponding to differing BiVO4/CoPi photoanodes under sunlight illumination.
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Figure 3. (a) LSV curves with 100% iR drop compensation and a 0.1 mV s−1 scanning rate, (b) Tafel plots, and (c) overpotential plots at a current density of 10 mA cm−2 of the electrochemical OER measurements with the BiVO4 and BiVO4/CoPi photoelectrode catalysts in 0.2 M Na2HPO4/NaH2PO4 solution (pH = 6.5) under dark conditions. (d) J-V curves of the BiVO4 and BiVO4/CoPi photoanodes under dark conditions and simulated sunlight irradiation; (e) J-V curves of the BiVO4 and BiVO4/CoPi photoanodes under sunlight illumination. (f) Calculated ABPE values.
Figure 3. (a) LSV curves with 100% iR drop compensation and a 0.1 mV s−1 scanning rate, (b) Tafel plots, and (c) overpotential plots at a current density of 10 mA cm−2 of the electrochemical OER measurements with the BiVO4 and BiVO4/CoPi photoelectrode catalysts in 0.2 M Na2HPO4/NaH2PO4 solution (pH = 6.5) under dark conditions. (d) J-V curves of the BiVO4 and BiVO4/CoPi photoanodes under dark conditions and simulated sunlight irradiation; (e) J-V curves of the BiVO4 and BiVO4/CoPi photoanodes under sunlight illumination. (f) Calculated ABPE values.
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Figure 4. (a) Nyquist plots and equivalent circuit diagram (inset), where the small circles represent the raw data and the solid lines represent the fitting results, and (b) the corresponding Bode plots of the BiVO4 and BiVO4/CoPi photoanodes. M-S plots of (c) BiVO4 and (d) BiVO4/CoPi at a 1 kHz frequency.
Figure 4. (a) Nyquist plots and equivalent circuit diagram (inset), where the small circles represent the raw data and the solid lines represent the fitting results, and (b) the corresponding Bode plots of the BiVO4 and BiVO4/CoPi photoanodes. M-S plots of (c) BiVO4 and (d) BiVO4/CoPi at a 1 kHz frequency.
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Figure 5. (a) Wavelength-dependent absorbance and (b) the light harvesting efficiency (LHE) of the BiVO4 and BiVO4/CoPi photoanodes. (c) The integrated photocurrent density of the BiVO4 and BiVO4/CoPi photoanodes, as well as the energy density flux for the standard AM 1.5 G solar spectrum. (d) Transient photocurrent response of the BiVO4 and BiVO4/CoPi photoanodes.
Figure 5. (a) Wavelength-dependent absorbance and (b) the light harvesting efficiency (LHE) of the BiVO4 and BiVO4/CoPi photoanodes. (c) The integrated photocurrent density of the BiVO4 and BiVO4/CoPi photoanodes, as well as the energy density flux for the standard AM 1.5 G solar spectrum. (d) Transient photocurrent response of the BiVO4 and BiVO4/CoPi photoanodes.
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Table 1. Summary of the PEIS fitted parameters for FTO/BiVO4 and FTO/BiVO4/CoPi photoanodes.
Table 1. Summary of the PEIS fitted parameters for FTO/BiVO4 and FTO/BiVO4/CoPi photoanodes.
PhotoanodesRW (Ω)Rct (Ω)Csc (F)
FTO/BiVO418.8690.35.03 × 10−4
FTO/BiVO4/CoPi18.22137.95.20 × 10−4
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MDPI and ACS Style

Li, Z.; Xie, Z.; Li, W.; Aziz, H.S.; Abbas, M.; Zheng, Z.; Su, Z.; Fan, P.; Chen, S.; Liang, G. Charge Transport Enhancement in BiVO4 Photoanode for Efficient Solar Water Oxidation. Materials 2023, 16, 3414. https://doi.org/10.3390/ma16093414

AMA Style

Li Z, Xie Z, Li W, Aziz HS, Abbas M, Zheng Z, Su Z, Fan P, Chen S, Liang G. Charge Transport Enhancement in BiVO4 Photoanode for Efficient Solar Water Oxidation. Materials. 2023; 16(9):3414. https://doi.org/10.3390/ma16093414

Chicago/Turabian Style

Li, Zhidong, Zhibin Xie, Weibang Li, Hafiz Sartaj Aziz, Muhammad Abbas, Zhuanghao Zheng, Zhenghua Su, Ping Fan, Shuo Chen, and Guangxing Liang. 2023. "Charge Transport Enhancement in BiVO4 Photoanode for Efficient Solar Water Oxidation" Materials 16, no. 9: 3414. https://doi.org/10.3390/ma16093414

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