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Journal: Materials, 2022
Volume: 15
Number: 6285
6285
Article: Charge Storage and Reliability Characteristics of Nonvolatile Memory Capacitors with HfO₂/Al₂O₃-Based Charge Trapping Layers
Authors: by Dencho Spassov, Albena Paskaleva, Elżbieta Guziewicz, Wojciech Wozniak, Todor Stanchev, Tsvetan Ivanov, Joanna Wojewoda-Budka and Marta Janusz-Skuza
Link: https://www.mdpi.com/1996-1944/15/18/6285

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