Martins, J.; Bahubalindruni, P.; Rovisco, A.; Kiazadeh, A.; Martins, R.; Fortunato, E.; Barquinha, P.
Bias Stress and Temperature Impact on InGaZnO TFTs and Circuits. Materials 2017, 10, 680.
https://doi.org/10.3390/ma10060680
AMA Style
Martins J, Bahubalindruni P, Rovisco A, Kiazadeh A, Martins R, Fortunato E, Barquinha P.
Bias Stress and Temperature Impact on InGaZnO TFTs and Circuits. Materials. 2017; 10(6):680.
https://doi.org/10.3390/ma10060680
Chicago/Turabian Style
Martins, Jorge, Pydi Bahubalindruni, Ana Rovisco, Asal Kiazadeh, Rodrigo Martins, Elvira Fortunato, and Pedro Barquinha.
2017. "Bias Stress and Temperature Impact on InGaZnO TFTs and Circuits" Materials 10, no. 6: 680.
https://doi.org/10.3390/ma10060680
APA Style
Martins, J., Bahubalindruni, P., Rovisco, A., Kiazadeh, A., Martins, R., Fortunato, E., & Barquinha, P.
(2017). Bias Stress and Temperature Impact on InGaZnO TFTs and Circuits. Materials, 10(6), 680.
https://doi.org/10.3390/ma10060680