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Journal: Sensors, 2020
Volume: 20
Number: 727

Article: Fully Depleted, Trench-Pinned Photo Gate for CMOS Image Sensor Applications
Authors: by Francois Roy, Andrej Suler, Thomas Dalleau, Romain Duru, Daniel Benoit, Jihane Arnaud, Yvon Cazaux, Catherine Chaton, Laurent Montes, Panagiota Morfouli and Guo-Neng Lu
Link: https://www.mdpi.com/1424-8220/20/3/727

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