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Journal: Sensors, 2020
Volume: 20
Number: 727
Article:
Fully Depleted, Trench-Pinned Photo Gate for CMOS Image Sensor Applications
Authors:
by
Francois Roy, Andrej Suler, Thomas Dalleau, Romain Duru, Daniel Benoit, Jihane Arnaud, Yvon Cazaux, Catherine Chaton, Laurent Montes, Panagiota Morfouli and Guo-Neng Lu
Link:
https://www.mdpi.com/1424-8220/20/3/727
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