Next Article in Journal
On the Selection of Non-Invasive Methods Based on Speech Analysis Oriented to Automatic Alzheimer Disease Diagnosis
Previous Article in Journal
IPv6 Addressing Proxy: Mapping Native Addressing from Legacy Technologies and Devices to the Internet of Things (IPv6)
Article Menu

Export Article

Open AccessArticle

Reset Tree-Based Optical Fault Detection

Computer Engineering Department, Pusan National University, Busan 609-735, Korea
Electronic and Telecommunications Research Institute (ETRI), Daejeon 305-700, Korea
The Attached Institute of ETRI, Daejeon 305-811, Korea
Author to whom correspondence should be addressed.
Sensors 2013, 13(5), 6713-6729;
Received: 9 April 2013 / Revised: 12 May 2013 / Accepted: 13 May 2013 / Published: 21 May 2013
(This article belongs to the Section Physical Sensors)
PDF [358 KB, uploaded 21 June 2014]


In this paper, we present a new reset tree-based scheme to protect cryptographic hardware against optical fault injection attacks. As one of the most powerful invasive attacks on cryptographic hardware, optical fault attacks cause semiconductors to misbehave by injecting high-energy light into a decapped integrated circuit. The contaminated result from the affected chip is then used to reveal secret information, such as a key, from the cryptographic hardware. Since the advent of such attacks, various countermeasures have been proposed. Although most of these countermeasures are strong, there is still the possibility of attack. In this paper, we present a novel optical fault detection scheme that utilizes the buffers on a circuit’s reset signal tree as a fault detection sensor. To evaluate our proposal, we model radiation-induced currents into circuit components and perform a SPICE simulation. The proposed scheme is expected to be used as a supplemental security tool. View Full-Text
Keywords: optical fault; single event transient; soft-error; reset tree; fault detection optical fault; single event transient; soft-error; reset tree; fault detection
This is an open access article distributed under the Creative Commons Attribution License (CC BY 3.0).

Share & Cite This Article

MDPI and ACS Style

Lee, D.-G.; Choi, D.; Seo, J.; Kim, H. Reset Tree-Based Optical Fault Detection. Sensors 2013, 13, 6713-6729.

Show more citation formats Show less citations formats

Related Articles

Article Metrics

Article Access Statistics



[Return to top]
Sensors EISSN 1424-8220 Published by MDPI AG, Basel, Switzerland RSS E-Mail Table of Contents Alert
Back to Top