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Journal: Molecules, 2023
Volume: 28
Number: 1134
Article:
Reliability Characteristics of Metal-Insulator-Semiconductor Capacitors with Low-Dielectric-Constant Materials
Authors:
by
Yi-Lung Cheng, Wei-Fan Peng, Chi-Jia Huang, Giin-Shan Chen and Jau-Shiung Fang
Link:
https://www.mdpi.com/1420-3049/28/3/1134
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