Search Results (43)

Under the dual impetus of environmental regulations and reliability requirements, the Pb–free/Pb hybrid assembly process in aerospace-grade ball grid array (BGA) components has become an unavoidable industrial imperative. However, constrained process compatibility during single or multiple reflow protocols amplifies structural heterogeneity in solder joints and accelerates dynamic microstructural evolution, thereby elevating interfacial reliability risks at solder joint interfaces. This paper systematically investigated phase composition, grain dimensions, thickness evolution, and crystallographic orientation patterns of interfacial intermetallic compounds (IMCs) in hybrid micro-solder joints under multiple reflows, employing electron backscatter diffraction (EBSD), scanning electron microscopy (SEM), and energy-dispersive X-ray spectroscopy (EDX). The result shows that the first reflow induces prismatic Cu₆Sn₅ grain formation driven by Pb aggregation zones and elevated Cu concentration gradients. Surface-protruding fine grains significantly increase kernel average misorientation (KAMave) of 0.68° while minimizing crystallographic orientation preference density (PF_max) of 15.5. Higher aspect ratios correlate with elongated grain morphology, consequently elevating grain size of 5.3 μm and IMC thickness of 5.0 μm. Subsequent reflows fundamentally alter material dynamics: Pb redistribution transitions from clustered to randomized spatial configurations, while grains develop pronounced in-plane orientation preferences that reciprocally influence Sn crystal alignment. The second reflow produces scallop-type grains with minimized dimensions of 4.0 μm and a thickness of 2.1 μm, with a KAMave of 0.37° and PF_max of 20.5. The third reflow initiates uniform growth of scalloped grains of 7.0 μm with a stable population density, whereas the fifth reflow triggers a semicircular grain transformation of 9.1 μm through conspicuous coalescence mechanisms. This work elucidates multiple reflow IMC growth mechanisms in Pb–free/Pb hybrid solder joints, providing critical theoretical and practical insights for optimizing hybrid technologies and reliability management strategies in high-reliability aerospace electronics. Full article

In this study, an interconnection was formed between a Cu/SnAg pillar bump and an Ni-less surface-treated Cu pad through laser-assisted bonding (LAB), and its bonding characteristics were evaluated. The LAB process influences the bond quality and mechanical strength based on the laser irradiation time and laser power density. The growth of the intermetallic compound (IMC) in the joint cross-section was observed via FE-SEM analysis. Under optimized LAB conditions, minimal IMC growth and high bonding strength were achieved compared to conventional thermo-compression bonding (TCB) and mass reflow (MR) processes. As the laser irradiation time and laser power density increased, solder splashing was observed at bump temperatures above 300 °C. This is hypothesized to be due to the rapid temperature rise causing the flux to vaporize explosively, resulting in simultaneous solder splashing. With increasing laser power density, the failure mode transitioned from the solder to the IMC. Full article

With the advancement of high-integration and high-density interconnection in chip manufacturing and packaging, Cu bumping technology in wafer- and panel- level packaging is developed to micrometer-sized structures and pitches to accommodate increased I/O numbers on high-end integrated circuits. Driven by this industrial demand, significant efforts have been dedicated to Cu electroplating techniques for improved pillar shape control and solder joint reliability, which substantially depend on additive formulations and electroplating parameters that regulate the growth morphology, crystal structure, and impurity incorporation in the process of electrodeposition. It is necessary to investigate the effect of an additive on Cu pillar electrodeposition, and to explore the Kirkendall voids formed during the reflowing process, which may result from the additive-induced impurity in the electrodeposited Cu pillars. In this work, a self-synthesized polyquaterntum (PQ) was made out with dual suppressor and leveler effects, and was combined with prototypical accelerator bis- (sodium sulfopropyl)-disulfide (SPS) for patterned Cu pillar electroplating. Then, Sn96.5/Ag3.0/Cu0.5 (SAC305) solder paste were screen printed on electroplated Cu pillars and undergo reflow soldering. Kirkendall voids formed at the joint interfaces were observed and quantified by SEM. Finally, XRD, and EBSD were employed to characterize the microstructure under varying conditions. The results indicate that PQ exhibits significant suppressive and levelled properties with the new structure of both leveler and suppressor. However, its effectiveness is dependent on liquid convection. PQ and SPS work synergistically, influencing the polarization effect in various convective environments. Consequently, uneven adsorption occurs on the surface of the Cu pillars, which results in more Kirkendall voids at the corners than at the center along the Cu pillar surface. Full article

In hard disk drive (HDD) manufacturing, a reflow soldering process (RSP) employs heat generated at the welding tip (WT) to bond tiny electrical components for assembling an HDD. Generally, the heat was generated by an electric current applied to the WT. This article reports a feasibility study of using hot air based on computational fluid dynamics (CFD), a choice to assist heat generation. First, the WT and hot air tube (HAT) prototypes were designed and created. The HAT is a device that helps to supply hot air directly to generate heat at the WT. Then, the experiment was established to measure the temperature (T) supplied by the hot air. The measure results were employed to validate the CFD results. Next, the prototype HAT was used to investigate the T generated at the WT by CFD. The comparison revealed that the T measured by the experiment was in the 106.2 °C–133.5 °C range and that the CFD was in the 107.3 °C–136.6 °C range. The maximum error of the CFD results is 2.3% compared to the experimental results, confirming the credibility of the CFD results and methodology. The CFD results revealed that the operating conditions, such as WT, HAT designs, hot air inlet velocity, and inlet temperature, influence the T. Last, examples of suitable operating conditions for using hot air were presented, which confirmed that hot air is a proper choice for a low-temperature RPS. Full article

In hard disk drive (HDD) manufacturing, a reflow soldering process (RSP) implements heat generated by the welding tip to melt a solder ball for bonding the following essential HDD components: a flexible printed circuit (FPC) and a printed circuit cable (PCC). Since the mentioned components are tiny and comprise many thin material layers, an experiment to study thermal and mechanical responses is complex and not worth it. Therefore, a static state multiphysics consisting of thermal analysis (TA) and structural analysis (SA) was employed to investigate both responses. First, the experiment was established to mimic the RSP, measuring the temperature generated by the actual welding tip. Then, the measured temperature was defined as the boundary conditions with the pressing force (F) for the TA and SA based on the actual operating conditions. As expected, the TA results revealed the temperature distribution in the HDD components, which was consistent with the theory and results from previous work and confirmed this work’s credibility. Significantly, the SA reported severe total deformation (δ) in FPC’s top and bottom ends. The maximum δ was 0.72–0.88 mm for the F of 0–1 N. The stronger the F, the greater the δ. This research highlights that multiphysics can investigate both responses in HDD components as slight as 0.1–100 microns thick, which can be used to develop a high-efficacy RSP. Full article

As the integration of chips in 3D integrated circuits (ICs) increases and the size of micro-bumps reduces, issues with the reliability of service due to electromigration and thermomigration are becoming more prevalent. In the practical application of solder joints, an increase in the grain size of intermetallic compounds (IMCs) has been observed during the reflow process. This phenomenon results in an increased thickness of the IMC layer, accompanied by a proportional increase in the volume of the IMC layer within the joint. The brittle nature of IMC renders it susceptible to excessive growth in small-sized joints, which has the potential to negatively impact the reliability of the welded joint. It is therefore of the utmost importance to regulate the formation and growth of IMCs. The following paper presents the electrodeposition of a Ni-W layer on a Cu substrate, forming a barrier layer. Subsequently, the barrier properties between the Sn/Cu reactive couples were subjected to a comprehensive and systematic investigation. The study indicates that the Ni-W layer has the capacity to impede the diffusion of Sn atoms into Cu. Furthermore, the Ni-W layer is a viable diffusion barrier at the Sn/Cu interface. The “bright layer” Ni₂WSn₄ can be observed in all Ni-W coatings during the soldering reflow process, and its growth was almost linear. The structure of the Ni-W layer is such that it reduces the barrier properties that would otherwise be inherent to it. This is due to the “bright layer” Ni₂WSn₄ that covers the original Ni-W barrier layer. At a temperature of 300 °C for a duration of 600 s, the Ni-W barrier layer loses its blocking function. Once the “bright layer” Ni₂WSn₄ has completely covered the original Ni-W barrier layer, the diffusion activation energy for Sn diffusion into the Cu substrate side will be significantly reduced, particularly in areas where the distortion energy is concentrated due to electroplating tension. Both the “bright layer” Ni₂WSn₄ and Sn will grow rapidly, with the formation of Cu-Sn intermetallic compounds (IMCs). At temperatures of 250 °C, the growth of Ni₃Sn₄-based IMCs is controlled by grain boundaries. Conversely, the growth of the Ni₂WSn₄ layer (consumption of Ni-W layer) is influenced by a combination of grain boundary diffusion and bulk diffusion. At temperatures of 275 °C and 300 °C, the growth of Ni₃Sn₄-based IMCs and the Ni₂WSn₄ layer (consumption of Ni-W layer) are both controlled by grain boundaries. The findings of this study can inform the theoretical design of solder joints with barrier layers as well as the selection of Ni-W diffusion barrier layers for use in different soldering processes. This can, in turn, enhance the reliability of microelectronic devices, offering significant theoretical and practical value. Full article

This study presents a new approach to investigating the impact of repeated reflow on the failure of ball grid array (BGA) packages. The issue with the BGA package collapse is that the repeated reflow can lead to short circuits, particularly for BGAs with a very fine pitch between leads. A novel approach was developed to measure the collapse of BGA solder balls during the melting and solidification process, enabling in situ measurements. The study focused on two types of solders: Sn63Pb37 as a reference, and the commonly used SAC305, with measurements taken at various temperatures. The BGA samples were subjected to three different heating/cooling cycles in a thermomechanical analyzer (TMA) at temperatures of 250 °C, 280 °C, and 300 °C, with a subsequent cooling down to 100 °C. The results obtained from the TMA indicated differences in the collapse behavior of both BGA solder alloys at various temperatures. Short circuits between neighboring leads (later confirmed by an X-ray analysis) were also recognizable on the TMA. The novel approach was successfully developed and applied, yielding clear insights into the behavior of solder balls during repeated reflow. Full article

Sn-Cu-Ni lead-free solder alloy electrodeposited on copper substrate from a deep eutectic solvent (DES)-based electrolyte under direct current (DC) and pulsed current (PC) was subjected to a reflowing process at the industrial company MIBATRON S.R.L. (Otopeni, Romania). The alteration of the alloy’s composition and anti-corrosive properties upon exposure to the reflow process were investigated via Scanning Electron Microscopy (SEM-EDX), X-ray diffraction (XRD), linear sweep voltammetry (LSV) and electrochemical impedance spectroscopy (EIS). Corrosion studies conducted in sodium chloride solution revealed that the system obtained under the DC plating mode (Sn-Cu-Ni-DC) exhibited enhanced anti-corrosive properties compared to the system obtained under PC (Sn-Cu-Ni-PC) after reflowing. However, prior to reflowing, the opposite effect was observed, with Sn-Cu-Ni-PC showing improved anti-corrosive properties. These changes in anti-corrosive behavior were attributed to the modification of the alloy’s composition during the reflowing process. Full article

The nozzle-matrix gas flow velocity has a great influence on the accuracy of the temperature field of a printed circuit board assembly (PCBA) during the hot air convection reflow soldering process. This paper proposes a new approach that integrates the theoretical calculation, numerical simulation and an experimental test to accurately determine the nozzle-matrix gas flow velocity. First, the temperature profile of the aluminum alloy thin plate in convection reflow ovens is measured using a Wiken tester. Second, the nozzle-matrix gas flow velocity is theoretically calculated with the Martin formula. The computational fluid dynamic (CFD)simulation is performed according to the Icepak code, where a single oven chamber model is established to represent the 10 zones of soldering ovens to reduce computational resources considering the supry of the soldering ovens. The simulated temperature profile of the aluminum alloy thin plate is obtained and the specific response surface model (RSM) is established to represent the deviation between the simulated temperature and the measured temperature. Finally, based on reverse problem analysis, non-linear programming by quadratic Lagrangian (NLPQL) is used to solve the mathematical optimization model with the objective of minimizing the temperature deviation to obtain the corrected nozzle-matrix gas flow velocity. To validate the accuracy, the temperature test and the modeling using the corrected gas flow velocity for a new PCBA component for the soldering ovens is conducted separately. The temperature comparison between the simulation and the test shows that the maximum temperature deviation is within 10 °C. This provides evidence that the nozzle-matrix gas flow velocity obtained by the new approach is accurate and effective. Full article

The process design of hot air reflow soldering is one of the key factors affecting the quality of PCBA (Printed Circuit Board Assembly) component products. In order to improve the product quality during the design process, this paper proposes a robust optimization-based finite element simulation analysis method including significant influencing factor screening, robustness evaluation, robust optimization, and reliability verification for the reflow soldering process. The simulation model of the reflow soldering process temperature field based on experiments is constructed and validated. Sensitivity analysis is used to select important influencing factors, such as the last five set temperature zones (T5 to T9) in the reflow oven and the thermal properties of materials such as PCBs (printed circuit boards), BGAs (ball grid arrays), and solder paste, as well as noise factors like the heating environment during the soldering process. Several surrogate models are used to construct the response surface, and the optimal fitting scheme is selected to effectively avoid poor fitting caused by inappropriate surrogate models. The 6σ robust optimization approach is introduced to evaluate and optimize the robustness of the process design parameter where the heating factor is chosen as the optimization target. The reliability analysis method is employed to validate the product quality. This paper establishes a comprehensive robustness analysis method for hot air reflow soldering, effectively reducing design costs and addressing the lack of robustness analysis in the current hot air reflow soldering process design. Full article

This paper gives a review of different applications in the numerical modelling of reflow soldering technology from recent years. The focus was on detailing the different process types, the physical background, and related mathematical models. Reflow soldering is the main connection technology of surface mounting. Firstly, the solder in paste form is stencil-printed onto the solder pads of the applied substrate, and then surface mounted devices are placed onto the solder deposits. Finally, the whole assembly is heated over the melting temperature of the solder alloy, which melts and forms solder joints. Surface mounting technology needs a low defect rate which is determined by process parameters, material properties, and the printed circuit board design. Accompanying the experiment and measurement, the identification and elimination of root causes can be effectively improved with numerical modelling, which also grants details to such physical mechanisms that are not even conventionally measurable. This paper is dealing with the following topics from the modelling point of view: an introduction of the different reflow technologies; a brief introduction of primary partial differential equations and calculation procedures; heat transfer mechanisms and thermomechanical stresses; and a brief summary of the results of selected studies. A short overview is also given about soft computing methods applied in reflow process optimisation. Full article

The growth and formation of primary intermetallics formed in Sn-3.5Ag soldered on copper organic solderability preservative (Cu-OSP) and electroless nickel immersion gold (ENIG) surface finish after multiple reflows were systematically investigated. Real-time synchrotron imaging was used to investigate the microstructure, focusing on the in situ growth behavior of primary intermetallics during the solid–liquid–solid interactions. The high-speed shear test was conducted to observe the correlation of microstructure formation to the solder joint strength. Subsequently, the experimental results were correlated with the numerical Finite Element (FE) modeling using ANSYS software to investigate the effects of primary intermetallics on the reliability of solder joints. In the Sn-3.5Ag/Cu-OSP solder joint, the well-known Cu₆Sn₅ interfacial intermetallic compounds (IMCs) layer was observed in each reflow, where the thickness of the IMC layer increases with an increasing number of reflows due to the Cu diffusion from the substrate. Meanwhile, for the Sn-3.5Ag/ENIG solder joints, the Ni₃Sn₄ interfacial IMC layer was formed first, followed by the (Cu, Ni)₆Sn₅ IMC layer, where the formation was detected after five cycles of reflow. The results obtained from real-time imaging prove that the Ni layer from the ENIG surface finish possessed an effective barrier to suppress and control the Cu dissolution from the substrates, as there is no sizeable primary phase observed up to four cycles of reflow. Thus, this resulted in a thinner IMC layer and smaller primary intermetallics, producing a stronger solder joint for Sn-3.5Ag/ENIG even after the repeated reflow process relative to the Sn-3.5Ag/Cu-OSP joints. Full article

The thermal warpage of a server-computer-used DIMM socket-PCB assembly after the solder reflow process is studied experimentally, theoretically, and numerically, especially along the socket lines and over the entire assembly. Strain gauge and shadow moiré are used for determining the coefficients of thermal expansion of the PCB and DIMM sockets and for measuring the thermal warpages of the socket-PCB assembly, respectively, while a newly proposed theory and a finite element method (FEM) simulation are used to calculate the thermal warpage of the socket-PCB assembly in order to understand its thermo-mechanical behavior and then further identify some important parameters. The results show that the theoretical solution validated by the FEM simulation provides the mechanics with the critical parameters. In addition, the cylindrical-like thermal deformation and warpage, measured by the moiré experiment, are also consistent with the theory and FEM simulation. Moreover, the results of the thermal warpage of the socket-PCB assembly from the strain gauge suggest a warpage dependence on the cooling rate during the solder reflow process, due to the nature of the creep behavior in the solder material. Finally, the thermal warpages of the socket-PCB assemblies after the solder reflow processes are provided through a validated FEM simulation for future designs and verification. Full article

With the rise of Industry 4.0, its pillars (which include Internet of Things, “Big Data”, data analytics, augmented reality, cybersecurity, etc.) have become unavoidable tendencies for the automated manufacturing industry. Equipment upgrade is required to match the new standards of digitally assisted automation. However, not all factories in the medium to small range (or independent manufacturers) can afford to upgrade their equipment. Therefore, the availability of affordable Industry 4.0 upgrades for now-outdated devices is necessary for manufacturers in the SME range (Small-Medium Enterprises) to stay relevant and profitable. More specifically, this work revolves around the automation of printed circuit board (PCB) manufacturing, which is one of the most popular and profitable areas involved in this movement; and within it, the large majority of manufacturing defects can be traced to the soldering or “reflow” stage. Manufacturing research must, thus, aim towards improving reflow ovens and, more specifically, aim to improve their autonomous capabilities and affordability. This work presents the design and results of a controlling interface utilizing a Raspberry Pi 4 as a coupling interface between an MQTT Broker (which monitors the overall system) and the oven itself (which is, intentionally, a sub-prime model which lacks native IoT support), resulting in successful, remote, network-based controlling and monitoring of the oven. Additionally, it documents the design and implementation of the network adaptations necessary for it to be considered a cybersecure IIoT Module and connect safely to the Production Cell’s Subnet. All of this to address the inclusion of specific Industry 4.0 needs such as autonomous functioning, data collection and cybersecurity in outdated manufacturing devices and help enrich the processes of SME PCB manufacturers. Full article

In this paper, we prepared a pure Sn microbump with a diameter of 30 µm using an electroplating method for a solder cap on a Cu post/Ni barrier and then determined its IMC characteristics and shear strength according to reflow recovery. In order to secure uniformity of the bump height, it was optimized through WID and WIW evaluation methods. Using an optimized plating system, bumps with a diameter of 30 µm, a height of 40 µm, and a space of 50 µm were formed on a 4-inch wafer. Shear strength was measured according to the number of reflows. IMC was evaluated through cross-sectional and plane analyses of bumps. Its correlation with shear strength according to the number of reflows was derived. The Sn plating system optimized each process condition according to the Sn concentration, current density, and temperature. The shape, surface condition, and height uniformity of the bump were quantified by a 3D profiler and FIB analysis. Height uniformity (WID) according to the concentration was confirmed to be approximately 2% when the Sn concentration was 60 g/L. WID according to the additive was confirmed to be 2% when the Sn concentration was 60 mL/L. WID according to the plating temperature was excellent in the shape of the bump at 30 °C, and a value of 2% was confirmed. The WIW for the Sn plating thickness on a 4-inch wafer was confirmed to have a value of ±3.88%. A shear test between the Cu and Sn junction was conducted to verify the shear strength of the manufactured bump. At this time, reflow was performed 1, 3, 5, 7, and 10 times for each sample. It was confirmed that as the number of flows increased, shear strength first increased. It then decreased sharply. It was confirmed that as the number of reflows increased, the thickness and cross-section area of the IMC first increased. They then gradually became saturated. The IMC between Cu and Sn was created in island form at the beginning of the reflow, resulting in increased roughness and shear strength. However, as the number of reflows increased, the roughness decreased since the IMC generated by the island was combined. The shear strength also decreased sharply. Full article