- Article
Single-Bilayer Graphene Test Structures for Kelvin Probe Microscopy
- Sergey P. Lebedev,
- Ilya A. Eliseyev,
- Mikhail S. Dunaevskiy,
- Ekaterina V. Gushchina and
- Alexander A. Lebedev
A new technique for determining the point spread function, which is required for measuring the surface potential using Kelvin probe microscopy (KPM), is presented. The method involves using a silicon carbide substrate coated with single-layer and bil...