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Swift Cluster Ion Beams: Basic Processes and Applications
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Swift Cluster Ion Beams: Basic Processes and Applications

A special issue of Quantum Beam Science (ISSN 2412-382X).

Deadline for manuscript submissions: closed (31 July 2022) | Viewed by 16294

Special Issue Editor

Dr. Hidetsugu Tsuchida

E-Mail Website
Guest Editor
Graduate School of Engineering, Quantum Science and Engineering Center, Kyoto University, Kyoto, Japan
Interests: elementary processes in the interaction of fast heavy-ions with matter; stopping power; radiation damage to biomolecules in liquid water; dynamics of ion damage in materials under irradiation; positron annihilation spectroscopy

Special Issue Information

Dear Colleagues,

Swift cluster ion beams obtained from an electrostatic ion accelerator have a unique property in that the electronic energy transfer into materials is extremely high; this is owing to the interference effect between the constitute atoms of the cluster (so-called vicinage effect). This property enables highly sensitive analyses or efficient processing of the surface of materials, which is difficult with conventional atomic ion beam technology. Therefore, swift cluster beams are expected to be applied in various fields of surface science and engineering, materials science, and bioscience. In this Special Issue, we will provide a place to disseminate advanced research on the basic science and applications of the irradiation effect of swift cluster ion beams on materials. Topics covered include:

  • Fundamentals of energy loss and linear energy transfer in matter.
  • Secondary particle emission (electrons, atomic/molecular/cluster ions, etc.).
  • Applications to surface analysis (two-dimensional molecular mapping with secondary ion mass spectrometry).
  • Applications to surface/interface science and technology (modification, nanostructure formation, processing, etc.).
  • Applications to bioscience (radiation damage to living organisms, DNA damage, irradiation-induced mutation, etc.).
  • Cluster acceleration technology (generation, transportation, beam focusing (including microbeams), irradiation methods, etc.).

We are looking forward to your submission of highly novel and original research results.

Dr. Hidetsugu Tsuchida
Guest Editor

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Quantum Beam Science is an international peer-reviewed open access quarterly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 1600 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • Electronic energy loss, high linear energy transfer (High-LET), stopping power
  • Radiation damage, including defect production in metals, semiconductors, and insulators
  • Surface science and engineering
  • Sputtering, surface modification, nanostructure formation, fabrications, etc.
  • Surface and interface analysis
  • Secondary ion mass spectrometry (SIMS)
  • Biological effects, DNA damage, mutation

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Published Papers (5 papers)

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Research

Jump to: Review

9 pages, 1983 KiB  
Article
Effects of Energetic Carbon-Cluster Ion Irradiation on Lattice Structures of EuBa2Cu3O7−x Oxide Superconductor
by Akihiro Iwase, Yuichi Saitoh, Atsuya Chiba, Fuminobu Hori and Norito Ishikawa
Quantum Beam Sci. 2022, 6(2), 21; https://doi.org/10.3390/qubs6020021 - 25 May 2022
Cited by 5 | Viewed by 2307
Abstract
C-axis-oriented EuBa2Cu3O7−x oxide films that were 100 nm thick were irradiated with 0.5 MeV C monoatomic ions, 2 MeV C4 cluster ions and 4 MeV C8 cluster ions at room temperature. Before and after the irradiation, [...] Read more.
C-axis-oriented EuBa2Cu3O7−x oxide films that were 100 nm thick were irradiated with 0.5 MeV C monoatomic ions, 2 MeV C4 cluster ions and 4 MeV C8 cluster ions at room temperature. Before and after the irradiation, X-ray diffraction (XRD) measurement was performed using Cu-Ka X-ray. The c-axis lattice constant increased almost linearly as a function of numbers of irradiating carbon ions, but it rarely depended on the cluster size. Cluster size effects were observed in the XRD peak intensity and the XRD peak width. With increasing the cluster size, the decrease in peak intensity becomes more remarkable and the peak width increases. The experimental result implies that the cluster ions with a larger size provide a more localized energy deposition in a sample, and cause larger and more inhomogeneous lattice disordering. As such, local and large lattice disordering acts as a pinning center for quantum vortex; energetic carbon-cluster ion irradiation will be effective for the increment in the critical current of EuBa2Cu3O7−x superconductors. Full article
(This article belongs to the Special Issue Swift Cluster Ion Beams: Basic Processes and Applications)
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8 pages, 1073 KiB  
Article
Sputtering Yields of Si Bombarded with 10–540-keV C60 Ions
by Kazumasa Narumi, Hiroshi Naramoto, Keisuke Yamada, Atsuya Chiba and Yuichi Saitoh
Quantum Beam Sci. 2022, 6(1), 12; https://doi.org/10.3390/qubs6010012 - 9 Mar 2022
Cited by 1 | Viewed by 2830
Abstract
Sputtering yields of Si have been measured for C60 ions in the energy range from 10 to 540 keV, where the nuclear stopping is dominant, by measuring thickness change of a pre-amorphized layer with conventional Rutherford-backscattering spectroscopy. The measured sputtering yield shows [...] Read more.
Sputtering yields of Si have been measured for C60 ions in the energy range from 10 to 540 keV, where the nuclear stopping is dominant, by measuring thickness change of a pre-amorphized layer with conventional Rutherford-backscattering spectroscopy. The measured sputtering yield shows the maximum, which is approximately 600 Si/C60, around 100 keV. Comparing with the sputtering yields for a monatomic ion calculated both based on the linear-collision-cascade theory of Sigmund and using the SRIM2008 code, nonlinear effect on the sputtering yield has been observed. The nonlinear effect depends on the energy of C60 ions: it is very large around the energies where the sputtering yield has the maximum and hardly observed at 10 keV. Full article
(This article belongs to the Special Issue Swift Cluster Ion Beams: Basic Processes and Applications)
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8 pages, 797 KiB  
Article
Incident Angle Dependent Formation of Ion Tracks in Quartz Crystal with C60+ Ions: Big Ions in Small Channels
by Hiroshi Amekura, Kazumasa Narumi, Atsuya Chiba, Yoshimi Hirano, Keisuke Yamada, Shunya Yamamoto and Yuichi Saitoh
Quantum Beam Sci. 2022, 6(1), 4; https://doi.org/10.3390/qubs6010004 - 12 Jan 2022
Cited by 2 | Viewed by 2656
Abstract
Quartz (SiO2) crystals possess intrinsic columnar pores perpendicular to (0001) surfaces, consisting of three- and six-membered ring (3MR and 6MR) structures of Si and O atoms. The diameters of the larger pores, i.e., 6 MRs, are ~0.49 nm, while the diameters [...] Read more.
Quartz (SiO2) crystals possess intrinsic columnar pores perpendicular to (0001) surfaces, consisting of three- and six-membered ring (3MR and 6MR) structures of Si and O atoms. The diameters of the larger pores, i.e., 6 MRs, are ~0.49 nm, while the diameters of fullerene (C60) ions are 0.7 nm, i.e., larger than either type of the pores. Transmission electron microscopy observation evidenced approximately two times longer ion tracks in the channeling condition, i.e., 0° incidence to (0001) surface, than an off-channeling condition, i.e., 7° incidence in this case, under 6 MeV C60 ion injection. The track length at the 0° incidence decreases more steeply than that at the 7° incidence with decreasing the energy from 6 MeV to 1 MeV. Finally, the track lengths at the 0° and 7° incidences become comparable, i.e., the channeling-like effect disappears at 1 MeV irradiation. This study experimentally indicates that the channeling-like effect of C60 ions is induced in quartz crystals, while the sizes of the channels are smaller than the C60 ions. Full article
(This article belongs to the Special Issue Swift Cluster Ion Beams: Basic Processes and Applications)
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7 pages, 1372 KiB  
Article
Proton-Cluster-Beam Lethality and Mutagenicity in Bacillus subtilis Spores
by Yoshihiro Hase, Katsuya Satoh, Atsuya Chiba, Yoshimi Hirano, Kengo Moribayashi and Kazumasa Narumi
Quantum Beam Sci. 2021, 5(3), 25; https://doi.org/10.3390/qubs5030025 - 28 Aug 2021
Cited by 4 | Viewed by 3950
Abstract
The unique energy transfer characteristics of swift cluster ions have attracted the attention of many researchers working on the analysis or processing of material surfaces, but the effects on living organisms remain unclear. We irradiated B. subtilis spores with monomer and cluster proton [...] Read more.
The unique energy transfer characteristics of swift cluster ions have attracted the attention of many researchers working on the analysis or processing of material surfaces, but the effects on living organisms remain unclear. We irradiated B. subtilis spores with monomer and cluster proton beams and examined their lethality; the 2 MeV H2+ shows a clearly lower lethality than 340 keV H+, even though both have a comparable linear energy transfer. The 2 MeV H2+ dissociates into a pair of 1 MeV H+ by losing the bonding electrons at the target surface. The estimated internuclear distance and the radial dose distribution suggest that the spread of deposited total energy over two areas separated by just several nanometers greatly diminishes beam lethality and that the energy density in the very center of the trajectory, possibly within a 1 nm radius, has a great impact on lethality. We also performed a whole genome resequencing of the surviving colonies to compare the molecular nature of mutations but failed to find a clear difference in overall characteristics. Our results suggest that cluster beams may be a useful tool for understanding biological effects of high linear energy transfer radiation. Full article
(This article belongs to the Special Issue Swift Cluster Ion Beams: Basic Processes and Applications)
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Review

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30 pages, 7860 KiB  
Review
MeV Cluster Ion Beam–Material Interaction
by Toshiaki Kaneko
Quantum Beam Sci. 2022, 6(1), 6; https://doi.org/10.3390/qubs6010006 - 24 Jan 2022
Cited by 4 | Viewed by 3101
Abstract
This paper treats the characteristic topics of MeV/atom cluster ion beams produced using tandem accelerators both in the production stage and in the penetration stage from the viewpoint of fundamental processes. The former is related to atomic collisions in that production and decay [...] Read more.
This paper treats the characteristic topics of MeV/atom cluster ion beams produced using tandem accelerators both in the production stage and in the penetration stage from the viewpoint of fundamental processes. The former is related to atomic collisions in that production and decay of a cluster ion Cn+ (n=1−4) colliding with a charge-changing rare gas underlined through the electron-loss process. Regarding the latter, relatively small carbon clusters Cn+ (n=2−10) are treated. The reduction effect of the average charge of cluster ions in a material is first presented. Next, the electronic stopping power and the energy loss, the polarization force, and the coulomb explosion under cluster-ion impact are described in the dielectric function form. Alignment and structure effects are stressed. As a large and highly symmetric cluster, the electronic stopping power and the average charge are shown for a C60 cluster ion moving inside a solid. Throughout the paper, it is emphasized that the vicinage effect originating from correlation on spatial structure and orientation of constituent ions plays the key role. Moreover, results obtained in cluster production and penetration phenomena are mostly different from multiplication of those under single-ion impact. Full article
(This article belongs to the Special Issue Swift Cluster Ion Beams: Basic Processes and Applications)
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