Functional Statistics: Outliers Detection and Quality Control, 2nd Edition
A special issue of Mathematics (ISSN 2227-7390). This special issue belongs to the section "Engineering Mathematics".
Deadline for manuscript submissions: closed (30 April 2024) | Viewed by 3242
Special Issue Editor
Interests: machine learning techniques: applications and new algorithms; functional statistics: outliers detection and quality control; image processing;
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
At present, a large amount of data can be approached from the functional prism and in a multitude of fields such as engineering, medicine, etc. An example of this, which is very important to the engineering field (mechanical, electronic, environmental, etc.), is quality control, which is based on the classical Schewart methodology or WECO rules.
However, while application is important, a comparison between methods, and the design and construction of a new model, univariable or multivariable, based on depth, non-parametric, etc., is also important. Thus, in this Special Issue, different articles are collected with new models of detection of functional outliers, or applications thereof, on different areas of quality control and process capability control.
Prof. Dr. Javier Martínez
Guest Editor
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Keywords
- Functional outliers
- Functional depth
- SPC
- Capability
- Control process
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