White-Light Interferometric Microscopy: Trends, Evolutions and Applications

Dear Colleagues,

White light interferometry techniques in the context of microscopy have evolved significantly over the last ten years, thanks to improvements in instrumentation, optical components, computing resources and the advanced use of signal processing. These techniques have contributed to the development of high performance innovative products for metrology and measurement in general, both at the surface and within transparent films and bulk materials. CSI is a recognised and commonly accepted technique now in industry as well as research. For example, the ISO 25178 standard, written in 2012 and reviewed in 2017, describes it as a suitable optical solution for non-contact 3D measurements, and classified in the coherence scanning interferometry methods.

This special issue focuses on new trends in this broad multidisciplinary field of optics/photonics, but also on new developments in instrumentation, innovative opto-mechanical set-ups, possible system improvements, implementation of new algorithms and digital processing.

Today, white light interferometry is widely used in many research and industrial fields in applications that cover non-contact and non-destructive measurement of static and moving surfaces, including roughness, topography and  3D structures, but also the characterisation of transparent films and bulk materials that can be linked to low coherence optical tomography solutions. In the latter case, this also opens up a whole new and exciting field of optical metrology with many consequences, whether in life, biomedical or materials science. This special issue will therefore bring you all the latest technological developments and new applications. We invite researchers and investigators to contribute their original research or review articles to this special issue. 

Dr. Manuel Flury
Guest Editor

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Applied Sciences is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

• Coherence Scanning Interferometry (CSI)
• Optical Metrology based on Low coherence or white light Interferometry
• surface metrology, topography, height measurements, roughness, three Dimensional Sensing using CSI
• Full Field Optical Coherence Tomography (FF-OCT)
• Optical Tomographic Techniques in relation with microscopy