Optical Metrology for Environmental Monitoring
A special issue of Applied Sciences (ISSN 2076-3417). This special issue belongs to the section "Optics and Lasers".
Deadline for manuscript submissions: 28 February 2026 | Viewed by 12
Special Issue Editors
Interests: signal and image analysis; imaging systems; digital holography; speckle metrology; optical metrology
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
Optical metrology has emerged as a powerful tool for addressing critical challenges in environmental monitoring, offering high sensitivity, non-invasiveness, and spatially-resolved measurements. As global concerns over climate change, pollution, and food security intensify, the need for accurate, real-time, and scalable monitoring techniques is becoming paramount. This Special Issue focuses on cutting-edge optical techniques applied to environmental monitoring tasks such as temperature field mapping in natural and industrial settings, the of microplastics in air and water, and the evaluation of agricultural products for quality and safety.
We invite contributions exploring the application and advancement of optical methods including speckle metrology, digital holography, interferometry, polarimetry, and hybrid optical systems. These approaches offer promising capabilities for remote sensing, multi-scale analysis, and in-field deployment under harsh environmental conditions. The integration of model-based analysis, machine learning, and adaptive optics further enhances their utility for complex and dynamic environments.
Potential topics include, but are not limited to, the following:
- Optical temperature and flow diagnostics in natural ecosystems;
- Microplastic detection and characterization;
- Non-destructive optical techniques for crop and soil monitoring;
- Advances in speckle-based and interferometric techniques;
- Holographic and 3D imaging for environmental assessment;
- Portable and real-time optical sensing systems.
- Advanced polarimetric techniques for non-invasive assessment;
- Novel computational algorithms; deep learning methods for image reconstruction and optimization.
Original research, case studies, tutorials, and comprehensive reviews are all welcome.
Dr. Davood Khodadad
Dr. Vipin Tiwari
Guest Editors
Manuscript Submission Information
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Keywords
- optical metrology
- speckle metrology
- digital holography
- polarimetry
- temperature measurement
- microplastics
- environmental optics
- agricultural monitoring
- non-destructive evaluation
- optical sensing
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