Aluminum Nitride – From Crystal Growth to Device Development

A special issue of Applied Sciences (ISSN 2076-3417). This special issue belongs to the section "Materials Science and Engineering".

Deadline for manuscript submissions: closed (20 June 2023) | Viewed by 678

Special Issue Editors


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Guest Editor
Former Head AlN at the Institute for Crystal Growth Berlin, 12489 Berlin, Germany
Interests: crystal growth; mineralogy

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Guest Editor
Ultratrend Technologies Co., Ltd., Hangzhou 311199, China
Interests: AlN crystal growth; crystal growth

Special Issue Information

Dear Colleagues,

Aluminum nitride (AlN) is an ideal material for a wide range of high-power and high-frequency applications (e.g., UV emitters and UV sensors in the wavelength range well below 200 nm, and for piezoelectric and temperature sensing at high temperatures) due to its outstanding electronic, mechanical and chemical properties (resistivity 107–1013 Wcm, band gap 6.2 eV, thermal conductivity 340 Wm-1K-1, thermal decomposition > 2400 °C, Mohs hardness 9).

The development of AlN technology is driven by a vital interest in higher energy efficiency, reduction of emissions from combustion engines, diagnostic capabilities in medicine and in the classical field of broadband communications.

To date, most applications of AlN have been based on the deposition of layers of nitride semiconductors by metal-organic chemical vapor deposition (MOCVD) on foreign substrates such as sapphire.
The use of AlN native substrates would bring dramatically better performance of the corresponding devices because of the reduction in defect density by orders of magnitude. The only known method to fabricate industrially relevant AlN single crystals is the PVT (sublimation/reconstruction) method at temperatures greater than 2000 °C. The associated problems, such as nucleation on native substrates, grain expansion, wafering or n-doping, are still the subject of intensive investigations.

Industrially, AlN wafers are available in very small quantities up to diameters of 2".

Dr. Jürgen Wollweber
Prof. Dr. Liang Wu
Guest Editors

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Keywords

  • Aluminum nitride
  • AlN
  • single crystals
  • crystal growth
  • PVT
  • sublimation
  • wafer
  • MOCVD
  • native substrate
  • sapphire
  • device

Published Papers

There is no accepted submissions to this special issue at this moment.
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