Recent Advances and Future Challenges in Manufacturing Metrology
A special issue of Applied Sciences (ISSN 2076-3417). This special issue belongs to the section "Applied Industrial Technologies".
Deadline for manuscript submissions: 20 March 2026 | Viewed by 7
Special Issue Editors
Interests: metrology; surface metrology; coordinate measuring technique; sensors applications; metrology of geometric quantities; multisensor measurement systems; dynamic metrology; measurement systems in mechanical engineering
Interests: metrology; micro-computed tomography (micro-CT); coordinate measuring technique; additive manufacturing
Interests: surface engineering; tribology; additive manufacturing; WAAM, dimensional metrology; machining; robotics
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
The improvement in the quality of production processes for machine and equipment parts is closely linked to advancements in the methods and tools used to control and inspect manufactured products. Increasing customer demands require continuous quality enhancement, achieved by reducing production time and improving the efficiency of components manufactured. As a result, manufacturers are compelled to invest in modern technological and production machinery.
This, in turn, drives the parallel development of quality control departments and the adoption of increasingly precise and/or fast advanced measuring instruments. Consequently, developments in science and technology rely on access to reliable information about the surrounding world. The foundation of such knowledge is research and, inherently, measurement in the broadest sense.
Modern industry requires simple, user-friendly devices capable of delivering rapid measurements, often in real time during processing, without compromising accuracy. To meet this growing demand, manufacturers are increasingly focusing on automated production process control systems in many cases supported by AI. The successful implementation of such systems depends primarily on the reliability and comprehensiveness of monitoring technologies; that is, the availability of accurate measurement data throughout the manufacturing process.
As part of Industry 4.0, modern industry expects research institutions to significantly streamline measurement processes. This involves both minimizing human errors and maximizing the quantity and quality of information obtained about product characteristics, which is often gathered simultaneously from multiple, reliable sources.
We invite contributions to this Special Issue on topics including, but not limited to, the following areas:
- Metrology in manufacturing processes
- Metrology systems in Industry 4.0
- Measurement systems
- Measurements across nano-, micro-, meso-, and macro-scales
- In-line and at-line measurement systems
- Geometrical product specification
- Coordinate measuring techniques
- Multisensor measurement systems
- Micro-computed tomography (micro-CT)
- Digital twins in metrology
- Artificial intelligence (AI) in metrology
- Measurement uncertainty and its estimation
- Calibration methods
Dr. Michał Jakubowicz
Dr. Bartosz Gapiński
Dr. Alejandro Pereira
Guest Editors
Manuscript Submission Information
Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.
Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Applied Sciences is an international peer-reviewed open access semimonthly journal published by MDPI.
Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.
Keywords
- metrology
- measurement system
- coordinate measuring technique
- multisensory
- uncertainty
- geometrical product specification
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