Abedi, M.; Abedi, Z.; Hemmady, S.; Schamiloglu, E.; Zarkesh-Ha, P.
EMI-Induced Eye Diagram Degradation in CMOS Inverter: Experimental Analysis and Predictive Modeling. Microelectronics 2026, 2, 12.
https://doi.org/10.3390/microelectronics2030012
AMA Style
Abedi M, Abedi Z, Hemmady S, Schamiloglu E, Zarkesh-Ha P.
EMI-Induced Eye Diagram Degradation in CMOS Inverter: Experimental Analysis and Predictive Modeling. Microelectronics. 2026; 2(3):12.
https://doi.org/10.3390/microelectronics2030012
Chicago/Turabian Style
Abedi, Mohammad, Zahra Abedi, Sameer Hemmady, Edl Schamiloglu, and Payman Zarkesh-Ha.
2026. "EMI-Induced Eye Diagram Degradation in CMOS Inverter: Experimental Analysis and Predictive Modeling" Microelectronics 2, no. 3: 12.
https://doi.org/10.3390/microelectronics2030012
APA Style
Abedi, M., Abedi, Z., Hemmady, S., Schamiloglu, E., & Zarkesh-Ha, P.
(2026). EMI-Induced Eye Diagram Degradation in CMOS Inverter: Experimental Analysis and Predictive Modeling. Microelectronics, 2(3), 12.
https://doi.org/10.3390/microelectronics2030012