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Journal: Toxics, 2016
Volume: 4
Number: 5
Article:
Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS): A New Tool for the Analysis of Toxicological Effects on Single Cell Level
Authors:
by
Harald Jungnickel, Peter Laux and Andreas Luch
Link:
https://www.mdpi.com/2305-6304/4/1/5
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