Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS): A New Tool for the Analysis of Toxicological Effects on Single Cell Level
Jungnickel, H.; Laux, P.; Luch, A. Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS): A New Tool for the Analysis of Toxicological Effects on Single Cell Level. Toxics 2016, 4, 5. https://doi.org/10.3390/toxics4010005
Jungnickel H, Laux P, Luch A. Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS): A New Tool for the Analysis of Toxicological Effects on Single Cell Level. Toxics. 2016; 4(1):5. https://doi.org/10.3390/toxics4010005
Chicago/Turabian StyleJungnickel, Harald, Peter Laux, and Andreas Luch. 2016. "Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS): A New Tool for the Analysis of Toxicological Effects on Single Cell Level" Toxics 4, no. 1: 5. https://doi.org/10.3390/toxics4010005