Usman, A.; Bhatranand, A.; Jiraraksopakun, Y.; Kaewon, R.; Pawong, C.
Real-Time Double-Layer Thin Film Thickness Measurements Using Modified Sagnac Interferometer with Polarization Phase Shifting Approach. Photonics 2021, 8, 529.
https://doi.org/10.3390/photonics8120529
AMA Style
Usman A, Bhatranand A, Jiraraksopakun Y, Kaewon R, Pawong C.
Real-Time Double-Layer Thin Film Thickness Measurements Using Modified Sagnac Interferometer with Polarization Phase Shifting Approach. Photonics. 2021; 8(12):529.
https://doi.org/10.3390/photonics8120529
Chicago/Turabian Style
Usman, Abdullahi, Apichai Bhatranand, Yuttapong Jiraraksopakun, Rapeepan Kaewon, and Chutchai Pawong.
2021. "Real-Time Double-Layer Thin Film Thickness Measurements Using Modified Sagnac Interferometer with Polarization Phase Shifting Approach" Photonics 8, no. 12: 529.
https://doi.org/10.3390/photonics8120529
APA Style
Usman, A., Bhatranand, A., Jiraraksopakun, Y., Kaewon, R., & Pawong, C.
(2021). Real-Time Double-Layer Thin Film Thickness Measurements Using Modified Sagnac Interferometer with Polarization Phase Shifting Approach. Photonics, 8(12), 529.
https://doi.org/10.3390/photonics8120529