An Improved Mask2Former-HRNet Method for Insulator Defect Detection
Abstract
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Huo, Y.; Xiao, L.; Tang, Z.; Zhou, J.; Dai, X.; Xiao, Y.; Fang, X. An Improved Mask2Former-HRNet Method for Insulator Defect Detection. Processes 2025, 13, 316. https://doi.org/10.3390/pr13020316
Huo Y, Xiao L, Tang Z, Zhou J, Dai X, Xiao Y, Fang X. An Improved Mask2Former-HRNet Method for Insulator Defect Detection. Processes. 2025; 13(2):316. https://doi.org/10.3390/pr13020316
Chicago/Turabian StyleHuo, Yaoran, Lan Xiao, Zhenyu Tang, Jian Zhou, Xu Dai, Yuhao Xiao, and Xia Fang. 2025. "An Improved Mask2Former-HRNet Method for Insulator Defect Detection" Processes 13, no. 2: 316. https://doi.org/10.3390/pr13020316
APA StyleHuo, Y., Xiao, L., Tang, Z., Zhou, J., Dai, X., Xiao, Y., & Fang, X. (2025). An Improved Mask2Former-HRNet Method for Insulator Defect Detection. Processes, 13(2), 316. https://doi.org/10.3390/pr13020316

