Huo, Y.; Xiao, L.; Tang, Z.; Zhou, J.; Dai, X.; Xiao, Y.; Fang, X.
An Improved Mask2Former-HRNet Method for Insulator Defect Detection. Processes 2025, 13, 316.
https://doi.org/10.3390/pr13020316
AMA Style
Huo Y, Xiao L, Tang Z, Zhou J, Dai X, Xiao Y, Fang X.
An Improved Mask2Former-HRNet Method for Insulator Defect Detection. Processes. 2025; 13(2):316.
https://doi.org/10.3390/pr13020316
Chicago/Turabian Style
Huo, Yaoran, Lan Xiao, Zhenyu Tang, Jian Zhou, Xu Dai, Yuhao Xiao, and Xia Fang.
2025. "An Improved Mask2Former-HRNet Method for Insulator Defect Detection" Processes 13, no. 2: 316.
https://doi.org/10.3390/pr13020316
APA Style
Huo, Y., Xiao, L., Tang, Z., Zhou, J., Dai, X., Xiao, Y., & Fang, X.
(2025). An Improved Mask2Former-HRNet Method for Insulator Defect Detection. Processes, 13(2), 316.
https://doi.org/10.3390/pr13020316