Huo, Y.;                     Xiao, L.;                     Tang, Z.;                     Zhou, J.;                     Dai, X.;                     Xiao, Y.;                     Fang, X.    
        An Improved Mask2Former-HRNet Method for Insulator Defect Detection. Processes 2025, 13, 316.
    https://doi.org/10.3390/pr13020316
    AMA Style
    
                                Huo Y,                                 Xiao L,                                 Tang Z,                                 Zhou J,                                 Dai X,                                 Xiao Y,                                 Fang X.        
                An Improved Mask2Former-HRNet Method for Insulator Defect Detection. Processes. 2025; 13(2):316.
        https://doi.org/10.3390/pr13020316
    
    Chicago/Turabian Style
    
                                Huo, Yaoran,                                 Lan Xiao,                                 Zhenyu Tang,                                 Jian Zhou,                                 Xu Dai,                                 Yuhao Xiao,                                 and Xia Fang.        
                2025. "An Improved Mask2Former-HRNet Method for Insulator Defect Detection" Processes 13, no. 2: 316.
        https://doi.org/10.3390/pr13020316
    
    APA Style
    
                                Huo, Y.,                                 Xiao, L.,                                 Tang, Z.,                                 Zhou, J.,                                 Dai, X.,                                 Xiao, Y.,                                 & Fang, X.        
        
        (2025). An Improved Mask2Former-HRNet Method for Insulator Defect Detection. Processes, 13(2), 316.
        https://doi.org/10.3390/pr13020316