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Article

Dynamic and Static Calibration of Ultra-Low-Voltage, Digital-Based Operational Transconductance Amplifiers †

1
Department of Electronics and Telecommunications (DET), Politecnico di Torino, 10129 Turin, Italy
2
Graduate Program in Microelectronics (PGMICRO), Federal University of Rio Grande do Sul, 91501-970 Porto Alegre, Brazil
*
Author to whom correspondence should be addressed.
This paper is an extended version of our papers: P. Toledo, P. Crovetti, H. Klimach and S. Bampi, “A 300 mV-Supply, 2 nW-Power, 80 pF-Load CMOS Digital-Based OTA for IoT Interfaces”, IEEE International Conference on Electronics, Circuits and Systems (ICECS), Italy, 2019; and P. Toledo, O. Aiello and P. S. Crovetti, “A 300 mV-Supply Standard-Cell-Based OTA with Digital PWM Offset Calibration”, in IEEE Nordic Circuits and Systems Conference (NORCAS), Helsinki (FI), 2019.
Electronics 2020, 9(6), 983; https://doi.org/10.3390/electronics9060983
Received: 11 May 2020 / Revised: 2 June 2020 / Accepted: 5 June 2020 / Published: 12 June 2020
(This article belongs to the Special Issue Low-Voltage Integrated Circuits Design and Application)
The calibration of the effects of process variations and device mismatch in Ultra Low Voltage (ULV) Digital-Based Operational Transconductance Amplifiers (DB-OTAs) is addressed in this paper. For this purpose, two dynamic calibration techniques, intended to dynamically vary the effective strength of critical gates by different modulation strategies, i.e., Digital Pulse Width Modulation (DPWM) and Dyadic Digital Pulse Modulation (DDPM), are explored and compared to classic static calibration. The effectiveness of the calibration approaches as a mean to recover acceptable performance in non-functional samples is verified by Monte-Carlo (MC) post-layout simulations performed on a 300 mV power supply, nW-power DB-OTA in 180 nm CMOS. Based on the same MC post-layout simulations, the impact of each calibration strategy on silicon area, power consumption, and OTA performance is discussed. View Full-Text
Keywords: ultra-low-voltage; operational transconductance amplifier (OTA); digital-based OTA (DB-OTA); fully-digital design; dynamic calibration; static calibration ultra-low-voltage; operational transconductance amplifier (OTA); digital-based OTA (DB-OTA); fully-digital design; dynamic calibration; static calibration
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MDPI and ACS Style

Toledo, P.; Crovetti, P.; Klimach, H.; Bampi, S. Dynamic and Static Calibration of Ultra-Low-Voltage, Digital-Based Operational Transconductance Amplifiers. Electronics 2020, 9, 983. https://doi.org/10.3390/electronics9060983

AMA Style

Toledo P, Crovetti P, Klimach H, Bampi S. Dynamic and Static Calibration of Ultra-Low-Voltage, Digital-Based Operational Transconductance Amplifiers. Electronics. 2020; 9(6):983. https://doi.org/10.3390/electronics9060983

Chicago/Turabian Style

Toledo, Pedro, Paolo Crovetti, Hamilton Klimach, and Sergio Bampi. 2020. "Dynamic and Static Calibration of Ultra-Low-Voltage, Digital-Based Operational Transconductance Amplifiers" Electronics 9, no. 6: 983. https://doi.org/10.3390/electronics9060983

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