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Article

The L3Pilot Data Management Toolchain for a Level 3 Vehicle Automation Pilot

1
Institute for Automotive Engineering, RWTH Aachen University, Steinbachstr. 7, 52074 Aachen, Germany
2
Automated Vehicles, VTT Technical Research Centre of Finland Ltd, Visiokatu 4, 33720 Tampere, Finland
3
Department of Electrical, Electronics and Telecommunication Engineering and Naval Architecture (DITEN), University of Genova, 16145 Genova, Italy
4
Assisted & Automated Driving, Jaguar Land Rover, Gaydon CV35 0RR, UK
5
SAFER, Chalmers University of Technology, 417 56 Göteborg, Sweden
6
Warwick Manufacturing Group (WMG), University of Warwick, Coventry CV4 7AL, UK
*
Author to whom correspondence should be addressed.
Electronics 2020, 9(5), 809; https://doi.org/10.3390/electronics9050809
Received: 2 April 2020 / Revised: 4 May 2020 / Accepted: 11 May 2020 / Published: 15 May 2020
(This article belongs to the Special Issue Advanced Embedded HW/SW Development)
As industrial research in automated driving is rapidly advancing, it is of paramount importance to analyze field data from extensive road tests. This paper investigates the design and development of a toolchain to process and manage experimental data to answer a set of research questions about the evaluation of automated driving functions at various levels, from technical system functioning to overall impact assessment. We have faced this challenge in L3Pilot, the first comprehensive test of automated driving functions (ADFs) on public roads in Europe. L3Pilot is testing ADFs in vehicles made by 13 companies. The tested functions are mainly of Society of Automotive Engineers (SAE) automation level 3, some of them of level 4. In this context, the presented toolchain supports various confidentiality levels, and allows cross-vehicle owner seamless data management, with the efficient storage of data and their iterative processing with a variety of analysis and evaluation tools. Most of the toolchain modules have been developed to a prototype version in a desktop/cloud environment, exploiting state-of-the-art technology. This has allowed us to efficiently set up what could become a comprehensive edge-to-cloud reference architecture for managing data in automated vehicle tests. The project has been released as open source, the data format into which all vehicular signals, recorded in proprietary formats, were converted, in order to support efficient processing through multiple tools, scalability and data quality checking. We expect that this format should enhance research on automated driving testing, as it provides a shared framework for dealing with data from collection to analysis. We are confident that this format, and the information provided in this article, can represent a reference for the design of future architectures to implement in vehicles. View Full-Text
Keywords: automated vehicles; field operational tests; edge-to-cloud architectures; reference architecture; big data; data toolchain; Internet of things; IoT automated vehicles; field operational tests; edge-to-cloud architectures; reference architecture; big data; data toolchain; Internet of things; IoT
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MDPI and ACS Style

Hiller, J.; Koskinen, S.; Berta, R.; Osman, N.; Nagy, B.; Bellotti, F.; Rahman, A.; Svanberg, E.; Weber, H.; Arnold, E.H.; Dianati, M.; De Gloria, A. The L3Pilot Data Management Toolchain for a Level 3 Vehicle Automation Pilot. Electronics 2020, 9, 809. https://doi.org/10.3390/electronics9050809

AMA Style

Hiller J, Koskinen S, Berta R, Osman N, Nagy B, Bellotti F, Rahman A, Svanberg E, Weber H, Arnold EH, Dianati M, De Gloria A. The L3Pilot Data Management Toolchain for a Level 3 Vehicle Automation Pilot. Electronics. 2020; 9(5):809. https://doi.org/10.3390/electronics9050809

Chicago/Turabian Style

Hiller, Johannes; Koskinen, Sami; Berta, Riccardo; Osman, Nisrine; Nagy, Ben; Bellotti, Francesco; Rahman, Ashfaqur; Svanberg, Erik; Weber, Hendrik; Arnold, Eduardo H.; Dianati, Mehrdad; De Gloria, Alessandro. 2020. "The L3Pilot Data Management Toolchain for a Level 3 Vehicle Automation Pilot" Electronics 9, no. 5: 809. https://doi.org/10.3390/electronics9050809

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