Feng, J.; Meng, T.; Lu, Y.; Ren, J.; Zhao, G.; Liu, H.; Yang, J.; Huang, R.
Nondestructive Testing of Hollowing Deterioration of the Yungang Grottoes Based on THz-TDS. Electronics 2020, 9, 625.
https://doi.org/10.3390/electronics9040625
AMA Style
Feng J, Meng T, Lu Y, Ren J, Zhao G, Liu H, Yang J, Huang R.
Nondestructive Testing of Hollowing Deterioration of the Yungang Grottoes Based on THz-TDS. Electronics. 2020; 9(4):625.
https://doi.org/10.3390/electronics9040625
Chicago/Turabian Style
Feng, Ju, Tianhua Meng, Yuhe Lu, Jianguang Ren, Guozhong Zhao, Hongmei Liu, Jin Yang, and Rong Huang.
2020. "Nondestructive Testing of Hollowing Deterioration of the Yungang Grottoes Based on THz-TDS" Electronics 9, no. 4: 625.
https://doi.org/10.3390/electronics9040625
APA Style
Feng, J., Meng, T., Lu, Y., Ren, J., Zhao, G., Liu, H., Yang, J., & Huang, R.
(2020). Nondestructive Testing of Hollowing Deterioration of the Yungang Grottoes Based on THz-TDS. Electronics, 9(4), 625.
https://doi.org/10.3390/electronics9040625