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Journal: Electronics, 2020
Volume: 9
Number: 1750
Article:
Electromagnetic Micro-Structure Non-Destructive Testing: Sparsity-Constrained and Combined Convolutional Recurrent Neural Network Methods
Authors:
by
Peipei Ran, Dominique Lesselier and Mohammed Serhir
Link:
https://www.mdpi.com/2079-9292/9/11/1750
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