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Journal: Electronics, 2019
Volume: 8
Number: 754

Article: Individual Phase Full-Power Testing Method for High-Power STATCOM
Authors: by Qingjun Huang, Bo Li, Yanjun Tan, Xinguo Mao, Siguo Zhu and Yuan Zhu
Link: https://www.mdpi.com/2079-9292/8/7/754

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