Reyneri, L.M.; Serrano-Cases, A.; Morilla, Y.; Cuenca-Asensi, S.; Martínez-Álvarez, A.
A Compact Model to Evaluate the Effects of High Level C++ Code Hardening in Radiation Environments. Electronics 2019, 8, 653.
https://doi.org/10.3390/electronics8060653
AMA Style
Reyneri LM, Serrano-Cases A, Morilla Y, Cuenca-Asensi S, Martínez-Álvarez A.
A Compact Model to Evaluate the Effects of High Level C++ Code Hardening in Radiation Environments. Electronics. 2019; 8(6):653.
https://doi.org/10.3390/electronics8060653
Chicago/Turabian Style
Reyneri, Leonardo Maria, Alejandro Serrano-Cases, Yolanda Morilla, Sergio Cuenca-Asensi, and Antonio Martínez-Álvarez.
2019. "A Compact Model to Evaluate the Effects of High Level C++ Code Hardening in Radiation Environments" Electronics 8, no. 6: 653.
https://doi.org/10.3390/electronics8060653
APA Style
Reyneri, L. M., Serrano-Cases, A., Morilla, Y., Cuenca-Asensi, S., & Martínez-Álvarez, A.
(2019). A Compact Model to Evaluate the Effects of High Level C++ Code Hardening in Radiation Environments. Electronics, 8(6), 653.
https://doi.org/10.3390/electronics8060653